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Information card for entry 7204120
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Coordinates | 7204120.cif |
---|---|
Original paper (by DOI) | HTML |
External links | ChemSpider |
Chemical name | 4,5-dibromo-4',5'-bis(2'-cyanoethylsulfanyl)- tetrathiafulvalene |
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Formula | C12 H8 Br2 N2 S6 |
Calculated formula | C12 H8 Br2 N2 S6 |
SMILES | BrC1=C(Br)SC(S1)=C1SC(=C(S1)SCCC#N)SCCC#N |
Title of publication | Synthesis and crystal engineering of new halogenated tetrathiafulvalene (TTF) derivatives and their charge transfer complexes and radical ion salts |
Authors of publication | Batsanov, Andrei S.; Bryce, Martin R.; Chesney, Antony; Howard, Judith A. K.; John, Derek E.; Moore, Adrian J.; Wood, Clare L.; Gershtenman, Hagit; Becker, James Y.; Khodorkovsky, Vladimir Y.; Ellern, Arkady; Bernstein, Joel; Perepichka, Igor F.; Rotello, Vincent; Gray, Mark; Cuello, Alejandro O. |
Journal of publication | Journal of Materials Chemistry |
Year of publication | 2001 |
Journal volume | 11 |
Journal issue | 9 |
Pages of publication | 2181 |
a | 14.609 ± 0.001 Å |
b | 11.607 ± 0.001 Å |
c | 21.02 ± 0.001 Å |
α | 90° |
β | 90° |
γ | 90° |
Cell volume | 3564.3 ± 0.4 Å3 |
Cell temperature | 150 ± 2 K |
Ambient diffraction temperature | 150 ± 2 K |
Number of distinct elements | 5 |
Space group number | 61 |
Hermann-Mauguin space group symbol | P b c a |
Hall space group symbol | -P 2ac 2ab |
Residual factor for all reflections | 0.0411 |
Residual factor for significantly intense reflections | 0.0291 |
Weighted residual factors for all reflections | 0.0655 |
Weighted residual factors for significantly intense reflections | 0.0571 |
Goodness-of-fit parameter for all reflections | 1.209 |
Goodness-of-fit parameter for significantly intense reflections | 1.185 |
Diffraction radiation wavelength | 0.71073 Å |
Diffraction radiation type | MoKα |
Has coordinates | Yes |
Has disorder | No |
Has Fobs | No |
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