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Information card for entry 7204122
Preview
| Coordinates | 7204122.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Chemical name | 4-iodo-4',5'-bis(methylsulfanyl)tetrathiafulvalene 7,7,8,8-tetracyanoquinodimethane |
|---|---|
| Formula | C20 H11 I N4 S6 |
| Calculated formula | C20 H10.97 I N4 S6 |
| Title of publication | Synthesis and crystal engineering of new halogenated tetrathiafulvalene (TTF) derivatives and their charge transfer complexes and radical ion salts |
| Authors of publication | Batsanov, Andrei S.; Bryce, Martin R.; Chesney, Antony; Howard, Judith A. K.; John, Derek E.; Moore, Adrian J.; Wood, Clare L.; Gershtenman, Hagit; Becker, James Y.; Khodorkovsky, Vladimir Y.; Ellern, Arkady; Bernstein, Joel; Perepichka, Igor F.; Rotello, Vincent; Gray, Mark; Cuello, Alejandro O. |
| Journal of publication | Journal of Materials Chemistry |
| Year of publication | 2001 |
| Journal volume | 11 |
| Journal issue | 9 |
| Pages of publication | 2181 |
| a | 7.969 ± 0.001 Å |
| b | 9.066 ± 0.001 Å |
| c | 17.482 ± 0.001 Å |
| α | 81.02 ± 0.01° |
| β | 83.25 ± 0.01° |
| γ | 77.12 ± 0.01° |
| Cell volume | 1211.7 ± 0.2 Å3 |
| Cell temperature | 295 ± 2 K |
| Ambient diffraction temperature | 295 ± 2 K |
| Number of distinct elements | 5 |
| Space group number | 2 |
| Hermann-Mauguin space group symbol | P -1 |
| Hall space group symbol | -P 1 |
| Residual factor for all reflections | 0.0777 |
| Residual factor for significantly intense reflections | 0.0412 |
| Weighted residual factors for all reflections | 0.0939 |
| Weighted residual factors for significantly intense reflections | 0.0761 |
| Goodness-of-fit parameter for all reflections | 1.077 |
| Goodness-of-fit parameter for significantly intense reflections | 1.093 |
| Diffraction radiation wavelength | 0.71073 Å |
| Diffraction radiation type | MoKα |
| Has coordinates | Yes |
| Has disorder | Yes |
| Has Fobs | No |
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