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Information card for entry 7204122
Preview
Coordinates | 7204122.cif |
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Original paper (by DOI) | HTML |
Chemical name | 4-iodo-4',5'-bis(methylsulfanyl)tetrathiafulvalene 7,7,8,8-tetracyanoquinodimethane |
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Formula | C20 H11 I N4 S6 |
Calculated formula | C20 H10.97 I N4 S6 |
Title of publication | Synthesis and crystal engineering of new halogenated tetrathiafulvalene (TTF) derivatives and their charge transfer complexes and radical ion salts |
Authors of publication | Batsanov, Andrei S.; Bryce, Martin R.; Chesney, Antony; Howard, Judith A. K.; John, Derek E.; Moore, Adrian J.; Wood, Clare L.; Gershtenman, Hagit; Becker, James Y.; Khodorkovsky, Vladimir Y.; Ellern, Arkady; Bernstein, Joel; Perepichka, Igor F.; Rotello, Vincent; Gray, Mark; Cuello, Alejandro O. |
Journal of publication | Journal of Materials Chemistry |
Year of publication | 2001 |
Journal volume | 11 |
Journal issue | 9 |
Pages of publication | 2181 |
a | 7.969 ± 0.001 Å |
b | 9.066 ± 0.001 Å |
c | 17.482 ± 0.001 Å |
α | 81.02 ± 0.01° |
β | 83.25 ± 0.01° |
γ | 77.12 ± 0.01° |
Cell volume | 1211.7 ± 0.2 Å3 |
Cell temperature | 295 ± 2 K |
Ambient diffraction temperature | 295 ± 2 K |
Number of distinct elements | 5 |
Space group number | 2 |
Hermann-Mauguin space group symbol | P -1 |
Hall space group symbol | -P 1 |
Residual factor for all reflections | 0.0777 |
Residual factor for significantly intense reflections | 0.0412 |
Weighted residual factors for all reflections | 0.0939 |
Weighted residual factors for significantly intense reflections | 0.0761 |
Goodness-of-fit parameter for all reflections | 1.077 |
Goodness-of-fit parameter for significantly intense reflections | 1.093 |
Diffraction radiation wavelength | 0.71073 Å |
Diffraction radiation type | MoKα |
Has coordinates | Yes |
Has disorder | Yes |
Has Fobs | No |
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