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Information card for entry 7204140
Preview
| Coordinates | 7204140.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Formula | C14 H26 In2 O4 |
|---|---|
| Calculated formula | C14 H26 In2 O4 |
| SMILES | C1(=CC(=[O][In]2([O]1[In]1(C)(C)[O]2C(=CC(=[O]1)C)C)(C)C)C)C |
| Title of publication | The X-ray single crystal structure of [Me2In(acac)]2 and its use as a single-source precursor for the deposition of indium oxide thin films |
| Authors of publication | Park, Jin-Ho; Horley, Graeme A.; O'Brien, Paul; Jones, Anthony C.; Motevalli, Majid |
| Journal of publication | Journal of Materials Chemistry |
| Year of publication | 2001 |
| Journal volume | 11 |
| Journal issue | 9 |
| Pages of publication | 2346 |
| a | 8.581 ± 0.005 Å |
| b | 8.507 ± 0.006 Å |
| c | 8.033 ± 0.006 Å |
| α | 108.39 ± 0.06° |
| β | 112.48 ± 0.05° |
| γ | 101.46 ± 0.05° |
| Cell volume | 478.9 ± 0.7 Å3 |
| Cell temperature | 293 ± 2 K |
| Ambient diffraction temperature | 293 ± 2 K |
| Number of distinct elements | 4 |
| Space group number | 2 |
| Hermann-Mauguin space group symbol | P -1 |
| Hall space group symbol | -P 1 |
| Residual factor for all reflections | 0.0199 |
| Residual factor for significantly intense reflections | 0.019 |
| Weighted residual factors for significantly intense reflections | 0.0501 |
| Weighted residual factors for all reflections included in the refinement | 0.0505 |
| Goodness-of-fit parameter for all reflections included in the refinement | 1.199 |
| Diffraction radiation wavelength | 0.71073 Å |
| Diffraction radiation type | MoKα |
| Has coordinates | Yes |
| Has disorder | No |
| Has Fobs | No |
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The link is: https://www.crystallography.net/7204140.html
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