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Information card for entry 7204264
Preview
Coordinates | 7204264.cif |
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Original paper (by DOI) | HTML |
Formula | C54 H42 N8 O8 Si |
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Calculated formula | C54 H42 N8 O8 Si |
SMILES | c12=Nc3[n]4[Si]56(n2c(=Nc2[n]5c(=Nc5c7ccccc7c(n65)N=c4c4ccccc34)c3c2cccc3)c2c1cccc2)(OC(=O)CCc1cc(OC)c(cc1)OC)OC(=O)CCc1cc(OC)c(OC)cc1 |
Title of publication | Synthesis, structure and optical characterisation of silicon phthalocyanine bis-esters |
Authors of publication | Christopher Farren; Simon FitzGerald; Martin R. Bryce; Andrew Beeby; Andrei S. Batsanov |
Journal of publication | J. Chem. Soc., Perkin Trans. 2 |
Year of publication | 2002 |
Journal issue | 1 |
Pages of publication | 59 - 66 |
a | 9.73 ± 0.001 Å |
b | 10.118 ± 0.001 Å |
c | 13.58 ± 0.001 Å |
α | 69.94 ± 0.01° |
β | 88.48 ± 0.01° |
γ | 61.66 ± 0.01° |
Cell volume | 1090.2 ± 0.2 Å3 |
Cell temperature | 105 ± 2 K |
Ambient diffraction temperature | 105 ± 2 K |
Number of distinct elements | 5 |
Space group number | 2 |
Hermann-Mauguin space group symbol | P -1 |
Hall space group symbol | -P 1 |
Residual factor for all reflections | 0.0451 |
Residual factor for significantly intense reflections | 0.0378 |
Weighted residual factors for significantly intense reflections | 0.0988 |
Weighted residual factors for all reflections included in the refinement | 0.1043 |
Goodness-of-fit parameter for all reflections included in the refinement | 1.031 |
Diffraction radiation wavelength | 0.71073 Å |
Diffraction radiation type | MoKα |
Has coordinates | Yes |
Has disorder | No |
Has Fobs | No |
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The link is: https://www.crystallography.net/7204264.html
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