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Information card for entry 7204327
Preview
| Coordinates | 7204327.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Formula | ? |
|---|---|
| Calculated formula | C34 H24 N4 O6 S12 |
| SMILES | C12=C(SCCS2)SC(S1)=C1SC2=C(OCCO2)S1.C1(OC)C(=C(C#N)C#N)C=C(C(=C(C#N)C#N)C=1)OC.C1(SC2=C(S1)SCCS2)=C1SC2=C(OCCO2)S1 |
| Title of publication | Complex formation of ethylenedioxyethylenedithiotetrathiafulvalene (EDOEDT-TTF: EOET) and its self-assembling ability |
| Authors of publication | Saito, Gunzi; Sasaki, Hiroshi; Aoki, Takashi; Yoshida, Yukihiro; Otsuka, Akihiro; Yamochi, Hideki; Drozdova, Olga O.; Yakushi, Kyuya; Kitagawa, Hiroshi; Mitani, Tadaoki |
| Journal of publication | Journal of Materials Chemistry |
| Year of publication | 2002 |
| Journal volume | 12 |
| Journal issue | 6 |
| Pages of publication | 1640 |
| a | 9.887 ± 0.004 Å |
| b | 12.024 ± 0.004 Å |
| c | 9.387 ± 0.004 Å |
| α | 94.75 ± 0.03° |
| β | 109.87 ± 0.04° |
| γ | 103.17 ± 0.03° |
| Cell volume | 1006.1 ± 0.8 Å3 |
| Cell temperature | 295 ± 2 K |
| Number of distinct elements | 5 |
| Space group number | 2 |
| Hermann-Mauguin space group symbol | P -1 |
| Hall space group symbol | -P 1 |
| Residual factor for significantly intense reflections | 0.055 |
| Weighted residual factors for significantly intense reflections | 0.064 |
| Goodness-of-fit parameter for significantly intense reflections | 1.276 |
| Diffraction radiation wavelength | 0.71073 Å |
| Diffraction radiation type | MoK-alpha |
| Has coordinates | Yes |
| Has disorder | No |
| Has Fobs | No |
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