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Information card for entry 7204560
Preview
Coordinates | 7204560.cif |
---|---|
Original paper (by DOI) | HTML |
Formula | C12 H28 B2 Cu F8 N8 O2 |
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Calculated formula | C12 H28 B2 Cu F8 N8 O2 |
SMILES | [Cu]12([NH]=C(NC(=[NH]1)OCC)NCC)[NH]=C(NC(=[NH]2)OCC)NCC.[B](F)(F)(F)[F-].[B](F)(F)(F)[F-] |
Title of publication | Complementarity of anion-mediated hydrogen-bonding and alkyl substitution in the construction of two-dimensional rhombic (4,4) grids by bis(N-alkylamidino-O-alkylurea)copper(ii) nitrates and tetrafluoroborates |
Authors of publication | Suksangpanya, Unchulee; Blake, Alexander J.; Hubberstey, Peter; Parker, David J.; Teat, Simon J.; Wilson, Claire |
Journal of publication | CrystEngComm |
Year of publication | 2003 |
Journal volume | 5 |
Journal issue | 4 |
Pages of publication | 23 |
a | 5.2725 ± 0.0005 Å |
b | 15.204 ± 0.0015 Å |
c | 13.9432 ± 0.0013 Å |
α | 90° |
β | 99.532 ± 0.002° |
γ | 90° |
Cell volume | 1102.3 ± 0.18 Å3 |
Cell temperature | 150 ± 2 K |
Ambient diffraction temperature | 150 ± 2 K |
Number of distinct elements | 7 |
Space group number | 4 |
Hermann-Mauguin space group symbol | P 1 21 1 |
Hall space group symbol | P 2yb |
Residual factor for all reflections | 0.0508 |
Residual factor for significantly intense reflections | 0.0456 |
Weighted residual factors for significantly intense reflections | 0.1135 |
Weighted residual factors for all reflections included in the refinement | 0.1152 |
Goodness-of-fit parameter for all reflections included in the refinement | 1.074 |
Diffraction radiation wavelength | 0.6942 Å |
Diffraction radiation type | Synchrotron |
Has coordinates | Yes |
Has disorder | No |
Has Fobs | No |
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The link is: https://www.crystallography.net/7204560.html
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