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Information card for entry 7204989
Preview
| Coordinates | 7204989.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Formula | C38 H32 N2 |
|---|---|
| Calculated formula | C38 H31 N2 |
| Title of publication | Tetraaryl biphenyl diamine hole transport materials: a structural study utilizing both single crystal and high resolution powder diffraction |
| Authors of publication | Kennedy, Alan R.; Smith, W. Ewen; Tackley, Daniel R.; David, William I. F.; Shankland, Kenneth; Brown, Bev; Teat, Simon J. |
| Journal of publication | Journal of Materials Chemistry |
| Year of publication | 2002 |
| Journal volume | 12 |
| Journal issue | 2 |
| Pages of publication | 168 |
| a | 11.068 ± 0.002 Å |
| b | 14.472 ± 0.002 Å |
| c | 17.82 ± 0.003 Å |
| α | 90° |
| β | 90° |
| γ | 90° |
| Cell volume | 2854.3 ± 0.8 Å3 |
| Cell temperature | 150 ± 2 K |
| Ambient diffraction temperature | 150 ± 2 K |
| Number of distinct elements | 3 |
| Space group number | 19 |
| Hermann-Mauguin space group symbol | P 21 21 21 |
| Hall space group symbol | P 2ac 2ab |
| Residual factor for all reflections | 0.0868 |
| Residual factor for significantly intense reflections | 0.0668 |
| Weighted residual factors for significantly intense reflections | 0.1485 |
| Weighted residual factors for all reflections included in the refinement | 0.1561 |
| Goodness-of-fit parameter for all reflections included in the refinement | 1.065 |
| Diffraction radiation wavelength | 0.6892 Å |
| Diffraction radiation type | synchrotron |
| Has coordinates | Yes |
| Has disorder | Yes |
| Has Fobs | No |
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The link is: https://www.crystallography.net/7204989.html
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structural data.