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Information card for entry 7205043
Preview
Coordinates | 7205043.cif |
---|---|
Original paper (by DOI) | HTML |
Formula | C39 H30 Cl2 Cr N6 O2 S14 |
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Calculated formula | C39 H30 Cl2 Cr N6 O2 S14 |
SMILES | [Cr](N=C=S)(N=C=S)([n]1ccc2ccccc2c1)(N=C=S)(N=C=S)[n]1ccc2ccccc2c1.ClCCl.S(CC)C1=C(SCC)SC(S1)=C1SC2SC(SC=2S1)=C1SC2=C(S1)OCCO2 |
Title of publication | Structural and magnetic properties of (C2TEO-TTP)[Cr(isoq)2(NCS)4]�CH2Cl2 |
Authors of publication | Sayaduzzaman, Mohammad; Katsuhara, Mao; Nii, Hirofumi; Kawamoto, Tadashi; Mori, Takehiko |
Journal of publication | CrystEngComm |
Year of publication | 2003 |
Journal volume | 5 |
Journal issue | 51 |
Pages of publication | 300 |
a | 13.977 ± 0.009 Å |
b | 18.93 ± 0.01 Å |
c | 10.148 ± 0.008 Å |
α | 105.71 ± 0.06° |
β | 106.23 ± 0.07° |
γ | 82.19 ± 0.05° |
Cell volume | 2476 ± 3 Å3 |
Cell temperature | 288.2 K |
Ambient diffraction temperature | 288.2 K |
Number of distinct elements | 7 |
Space group number | 2 |
Hermann-Mauguin space group symbol | P -1 |
Hall space group symbol | -P 1 |
Residual factor for all reflections | 0.054 |
Residual factor for significantly intense reflections | 0.055 |
Weighted residual factors for all reflections | 0.068 |
Weighted residual factors for all reflections included in the refinement | 0.068 |
Goodness-of-fit parameter for all reflections | 0.931 |
Goodness-of-fit parameter for all reflections included in the refinement | 0.93 |
Diffraction radiation wavelength | 0.7107 Å |
Diffraction radiation type | MoKα |
Has coordinates | Yes |
Has disorder | No |
Has Fobs | No |
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