Information card for entry 7205999
| Common name |
anilinium sulphate |
| Formula |
C12 H16 N2 O4 S |
| Calculated formula |
C12 H16 N2 O4 S |
| SMILES |
S(=O)(=O)([O-])[O-].[NH3+]c1ccccc1.[NH3+]c1ccccc1 |
| Title of publication |
Semi-organic salts of aniline with inorganic acids: prospective materials for the second harmonic generation |
| Authors of publication |
Matulková, Irena; Cihelka, Jaroslav; Fejfarová, Karla; Dušek, Michal; Pojarová, Michaela; Vaněk, Přemysl; Kroupa, Jan; Šála, Michal; Krupková, Radmila; Němec, Ivan |
| Journal of publication |
CrystEngComm |
| Year of publication |
2011 |
| Journal volume |
13 |
| Journal issue |
12 |
| Pages of publication |
4131 |
| a |
29.2672 ± 0.0013 Å |
| b |
6.2707 ± 0.0002 Å |
| c |
7.4449 ± 0.0002 Å |
| α |
90° |
| β |
95.612 ± 0.004° |
| γ |
90° |
| Cell volume |
1359.78 ± 0.08 Å3 |
| Cell temperature |
290 K |
| Ambient diffraction temperature |
290 K |
| Number of distinct elements |
5 |
| Space group number |
5 |
| Hermann-Mauguin space group symbol |
C 1 2 1 |
| Hall space group symbol |
C 2y |
| Residual factor for all reflections |
0.0515 |
| Residual factor for significantly intense reflections |
0.0476 |
| Weighted residual factors for significantly intense reflections |
0.1187 |
| Weighted residual factors for all reflections included in the refinement |
0.1223 |
| Goodness-of-fit parameter for significantly intense reflections |
1.72 |
| Goodness-of-fit parameter for all reflections included in the refinement |
1.68 |
| Diffraction radiation wavelength |
1.54184 Å |
| Diffraction radiation type |
CuKα |
| Has coordinates |
Yes |
| Has disorder |
No |
| Has Fobs |
No |
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https://www.crystallography.net/7205999.html