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Information card for entry 7206476
Preview
Coordinates | 7206476.cif |
---|---|
Original paper (by DOI) | HTML |
Formula | C60 H132 Cu6 I9 N3 |
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Calculated formula | C60 H132 Cu6 I9 N3 |
SMILES | [I]12345[Cu]6789%10[I]%11[Cu]%12%1339([I][Cu]4%10%11%13[I]7)[I][Cu]341%12[I][Cu]1754[I][Cu]287([I]6)[I]31.[N+](CCCCC)(CCCCC)(CCCCC)CCCCC.[N+](CCCCC)(CCCCC)(CCCCC)CCCCC.[N+](CCCCC)(CCCCC)(CCCCC)CCCCC |
Title of publication | Size matters—sometimes. The [CuxIy](y−x)−(NR4)+(y−x) systems |
Authors of publication | Jalilian, Ehsan; Lidin, Sven |
Journal of publication | CrystEngComm |
Year of publication | 2011 |
Journal volume | 13 |
Journal issue | 19 |
Pages of publication | 5730 |
a | 12.5384 ± 0.0001 Å |
b | 24.4794 ± 0.0004 Å |
c | 14.7686 ± 0.0002 Å |
α | 90° |
β | 110.433 ± 0.0015° |
γ | 90° |
Cell volume | 4247.76 ± 0.1 Å3 |
Cell temperature | 100 K |
Ambient diffraction temperature | 100 K |
Number of distinct elements | 5 |
Space group number | 4 |
Hermann-Mauguin space group symbol | P 1 21 1 |
Hall space group symbol | P 2yb |
Residual factor for all reflections | 0.0324 |
Residual factor for significantly intense reflections | 0.0324 |
Weighted residual factors for significantly intense reflections | 0.0641 |
Weighted residual factors for all reflections included in the refinement | 0.0649 |
Goodness-of-fit parameter for significantly intense reflections | 0.74 |
Goodness-of-fit parameter for all reflections included in the refinement | 0.74 |
Diffraction radiation wavelength | 0.71069 Å |
Diffraction radiation type | MoKα |
Has coordinates | Yes |
Has disorder | No |
Has Fobs | No |
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The link is: https://www.crystallography.net/7206476.html
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