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Information card for entry 7207257
Preview
Coordinates | 7207257.cif |
---|---|
Original paper (by DOI) | HTML |
Formula | C45 H66 Cu3 N6 O12 P3 S6 |
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Calculated formula | C45 H66 Cu3 N6 O12 P3 S6 |
SMILES | C1(=NP(OC(C)C)(OC(C)C)=[S][Cu]2[S]1[Cu]1[S]=P(N=C(Nc3c(cccc3)C(=O)OC)[S]1[Cu]1[S]=P(N=C(Nc3c(cccc3)C(=O)OC)[S]21)(OC(C)C)OC(C)C)(OC(C)C)OC(C)C)Nc1c(cccc1)C(=O)OC |
Title of publication | Homoleptic polynuclear CuI and AgI complexes of N-thiophosphorylated thioureas o-RO(O)CC6H4NHC(S)NHP(S)(OiPr)2 (R = Me, Et) |
Authors of publication | Safin, Damir A.; Babashkina, Maria G.; Bolte, Michael; Garcia, Yann |
Journal of publication | CrystEngComm |
Year of publication | 2012 |
Journal volume | 14 |
Journal issue | 3 |
Pages of publication | 774 |
a | 17.6497 ± 0.0002 Å |
b | 17.6497 ± 0.0002 Å |
c | 34.498 ± 0.0005 Å |
α | 90° |
β | 90° |
γ | 120° |
Cell volume | 9306.8 ± 0.2 Å3 |
Cell temperature | 173 ± 2 K |
Ambient diffraction temperature | 173 ± 2 K |
Number of distinct elements | 7 |
Space group number | 148 |
Hermann-Mauguin space group symbol | R -3 :H |
Hall space group symbol | -R 3 |
Residual factor for all reflections | 0.0473 |
Residual factor for significantly intense reflections | 0.032 |
Weighted residual factors for significantly intense reflections | 0.0899 |
Weighted residual factors for all reflections included in the refinement | 0.096 |
Goodness-of-fit parameter for all reflections included in the refinement | 1.058 |
Diffraction radiation wavelength | 0.71073 Å |
Diffraction radiation type | MoKα |
Has coordinates | Yes |
Has disorder | No |
Has Fobs | No |
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The link is: https://www.crystallography.net/7207257.html
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