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Information card for entry 7208413
Preview
Coordinates | 7208413.cif |
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Original paper (by DOI) | HTML |
Formula | C51.5 H55 Fe N6 O3 Se3 |
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Calculated formula | C51.5 H55 Fe N6 O3 Se3 |
SMILES | [Fe]123([Se]=C(N=C(O1)c1cc4ccccc4cc1)N(CC)CC)([Se]=C(N=C(O2)c1cc2ccccc2cc1)N(CC)CC)[Se]=C(N=C(O3)c1cc2ccccc2cc1)N(CC)CC.Cc1ccccc1 |
Title of publication | Deposition of iron selenide nanocrystals and thin films from tris(N,N-diethyl-N′-naphthoylselenoureato)iron(iii) |
Authors of publication | Akhtar, Masood; Akhtar, Javeed; Malik, Mohammad Azad; Tuna, Floriana; Helliwell, Madeleine; O'Brien, Paul |
Journal of publication | Journal of Materials Chemistry |
Year of publication | 2012 |
Journal volume | 22 |
Journal issue | 30 |
Pages of publication | 14970 |
a | 10.242 ± 0.005 Å |
b | 19.254 ± 0.009 Å |
c | 24.7 ± 0.012 Å |
α | 84.455 ± 0.007° |
β | 79.483 ± 0.008° |
γ | 89.85 ± 0.007° |
Cell volume | 4766 ± 4 Å3 |
Cell temperature | 100 ± 2 K |
Ambient diffraction temperature | 100 ± 2 K |
Number of distinct elements | 6 |
Space group number | 2 |
Hermann-Mauguin space group symbol | P -1 |
Hall space group symbol | -P 1 |
Residual factor for all reflections | 0.1218 |
Residual factor for significantly intense reflections | 0.1038 |
Weighted residual factors for significantly intense reflections | 0.2402 |
Weighted residual factors for all reflections included in the refinement | 0.249 |
Goodness-of-fit parameter for all reflections included in the refinement | 1.115 |
Diffraction radiation wavelength | 0.71073 Å |
Diffraction radiation type | MoKα |
Has coordinates | Yes |
Has disorder | No |
Has Fobs | No |
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