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Information card for entry 7208641
Preview
Coordinates | 7208641.cif |
---|---|
Original paper (by DOI) | HTML |
Formula | C14 H11 N2 Na O8 |
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Calculated formula | C14 H11 N2 Na O8 |
SMILES | C([O-])(=O)C(=O)[O-].[Na+].c1cc(cc[nH+]1)c1cc[nH+]cc1.OC(=O)C(=O)[O-] |
Title of publication | Crystal engineering through charge-assisted hydrogen bonds, multiple C‒H⋯O bonds and π‒π stacking: from (H2bipy)[Cu(ox)2] to (H2bipy)[NaH(ox)2] and (H2bipy)[H2(ox)2] (H2bipy = 4,4′-bipyridin-1,1′-dium; ox = oxalate) |
Authors of publication | Chen, Xiaocui; Han, Shumin; Wang, Ruiyao |
Journal of publication | CrystEngComm |
Year of publication | 2012 |
Journal volume | 14 |
Journal issue | 20 |
Pages of publication | 6400 |
a | 3.642 ± 0.0012 Å |
b | 9.706 ± 0.003 Å |
c | 10.459 ± 0.003 Å |
α | 109.23 ± 0.003° |
β | 100.133 ± 0.003° |
γ | 99.271 ± 0.003° |
Cell volume | 333.96 ± 0.18 Å3 |
Cell temperature | 180 ± 2 K |
Ambient diffraction temperature | 180 ± 2 K |
Number of distinct elements | 5 |
Space group number | 2 |
Hermann-Mauguin space group symbol | P -1 |
Hall space group symbol | -P 1 |
Residual factor for all reflections | 0.0438 |
Residual factor for significantly intense reflections | 0.0354 |
Weighted residual factors for significantly intense reflections | 0.0865 |
Weighted residual factors for all reflections included in the refinement | 0.0931 |
Goodness-of-fit parameter for all reflections included in the refinement | 1.094 |
Diffraction radiation wavelength | 0.71073 Å |
Diffraction radiation type | MoKα |
Has coordinates | Yes |
Has disorder | No |
Has Fobs | No |
For the version history of this entry, please navigate to main COD server.
The link is: https://www.crystallography.net/7208641.html
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Users of the data should acknowledge the original authors of the
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