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Information card for entry 7210096
Preview
| Coordinates | 7210096.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Formula | C24 H22 N4 Ni O2 S4 |
|---|---|
| Calculated formula | C24 H22 N4 Ni O2 S4 |
| SMILES | [Ni]12([S]=C(N(Cc3cnccc3)Cc3ccco3)S1)[S]=C(N(Cc1cnccc1)Cc1ccco1)S2 |
| Title of publication | Unusual C‒H⋯Ni anagostic interactions in new homoleptic Ni(ii) dithio complexes |
| Authors of publication | Rajput, Gunjan; Singh, Vikram; Gupta, Ajit N.; Yadav, Manoj Kumar; Kumar, Vinod; Singh, Santosh Kumar; Prasad, Akhilesh; Drew, Michael G. B.; Singh, Nanhai |
| Journal of publication | CrystEngComm |
| Year of publication | 2013 |
| Journal volume | 15 |
| Journal issue | 23 |
| Pages of publication | 4676 |
| a | 6.1216 ± 0.0011 Å |
| b | 10.3788 ± 0.0016 Å |
| c | 10.7918 ± 0.0009 Å |
| α | 78.834 ± 0.011° |
| β | 76.312 ± 0.012° |
| γ | 83.671 ± 0.013° |
| Cell volume | 652.08 ± 0.17 Å3 |
| Cell temperature | 293 ± 2 K |
| Ambient diffraction temperature | 293 ± 2 K |
| Number of distinct elements | 6 |
| Space group number | 2 |
| Hermann-Mauguin space group symbol | P -1 |
| Hall space group symbol | -P 1 |
| Residual factor for all reflections | 0.0897 |
| Residual factor for significantly intense reflections | 0.0575 |
| Weighted residual factors for significantly intense reflections | 0.1549 |
| Weighted residual factors for all reflections included in the refinement | 0.1758 |
| Goodness-of-fit parameter for all reflections included in the refinement | 0.968 |
| Diffraction radiation wavelength | 0.71073 Å |
| Diffraction radiation type | MoKα |
| Has coordinates | Yes |
| Has disorder | Yes |
| Has Fobs | No |
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