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Information card for entry 7210098
Preview
| Coordinates | 7210098.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Formula | C30 H22 Ni O2 S4 |
|---|---|
| Calculated formula | C30 H22 Ni O2 S4 |
| SMILES | C1(OCC2c3c(cccc3)c3c2cccc3)=[S][Ni]2([S]=C(OCC3c4ccccc4c4ccccc34)S2)S1 |
| Title of publication | Unusual C‒H⋯Ni anagostic interactions in new homoleptic Ni(ii) dithio complexes |
| Authors of publication | Rajput, Gunjan; Singh, Vikram; Gupta, Ajit N.; Yadav, Manoj Kumar; Kumar, Vinod; Singh, Santosh Kumar; Prasad, Akhilesh; Drew, Michael G. B.; Singh, Nanhai |
| Journal of publication | CrystEngComm |
| Year of publication | 2013 |
| Journal volume | 15 |
| Journal issue | 23 |
| Pages of publication | 4676 |
| a | 17.2196 ± 0.0009 Å |
| b | 5.8144 ± 0.0003 Å |
| c | 13.3549 ± 0.0006 Å |
| α | 90° |
| β | 98.728 ± 0.005° |
| γ | 90° |
| Cell volume | 1321.63 ± 0.12 Å3 |
| Cell temperature | 293 ± 2 K |
| Ambient diffraction temperature | 293 ± 2 K |
| Number of distinct elements | 5 |
| Space group number | 14 |
| Hermann-Mauguin space group symbol | P 1 21/c 1 |
| Hall space group symbol | -P 2ybc |
| Residual factor for all reflections | 0.109 |
| Residual factor for significantly intense reflections | 0.0586 |
| Weighted residual factors for significantly intense reflections | 0.1199 |
| Weighted residual factors for all reflections included in the refinement | 0.1413 |
| Goodness-of-fit parameter for all reflections included in the refinement | 1.004 |
| Diffraction radiation wavelength | 0.71073 Å |
| Diffraction radiation type | MoKα |
| Has coordinates | Yes |
| Has disorder | No |
| Has Fobs | No |
For the version history of this entry, please navigate to main COD server.
The link is: https://www.crystallography.net/7210098.html
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