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Information card for entry 7210332
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Coordinates | 7210332.cif |
---|---|
Original paper (by DOI) | HTML |
Chemical name | Rh_2_L1_2_CF3COO_2 |
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Formula | C44 H28 F16 O10 Rh2 |
Calculated formula | C44 H28 F16 O10 Rh2 |
SMILES | C1(C(F)(F)F)=[O][Rh]234([O]=C(c5ccc(cc5)C#Cc5c(F)c(F)c(F)c(F)c5F)O[Rh]4([O]=C(C(F)(F)F)O3)(O1)([O]=C(O2)c1ccc(cc1)C#Cc1c(F)c(F)c(F)c(F)c1F)[O]=C(CC)CC)[O]=C(CC)CC |
Title of publication | Arene‒perfluoroarene interactions for crystal engineering of metal complexes: Controlled self-assembly of paddle-wheel dimers |
Authors of publication | Itoh, Takahiro; Kondo, Mio; Kanaike, Mari; Masaoka, Shigeyuki |
Journal of publication | CrystEngComm |
Year of publication | 2013 |
Journal volume | 15 |
Journal issue | 31 |
Pages of publication | 6122 |
a | 9.51 ± 0.005 Å |
b | 9.693 ± 0.006 Å |
c | 13.597 ± 0.008 Å |
α | 103.857 ± 0.005° |
β | 100.543 ± 0.004° |
γ | 107.06 ± 0.008° |
Cell volume | 1119.2 ± 1.1 Å3 |
Cell temperature | 123 ± 2 K |
Ambient diffraction temperature | 123 ± 2 K |
Number of distinct elements | 5 |
Space group number | 2 |
Hermann-Mauguin space group symbol | P -1 |
Hall space group symbol | -P 1 |
Residual factor for all reflections | 0.0684 |
Residual factor for significantly intense reflections | 0.0587 |
Weighted residual factors for significantly intense reflections | 0.1575 |
Weighted residual factors for all reflections included in the refinement | 0.1615 |
Goodness-of-fit parameter for all reflections included in the refinement | 1.229 |
Diffraction radiation wavelength | 0.710747 Å |
Diffraction radiation type | MoKα |
Has coordinates | Yes |
Has disorder | No |
Has Fobs | No |
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The link is: https://www.crystallography.net/7210332.html
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Users of the data should acknowledge the original authors of the
structural data.