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Information card for entry 7210438
Preview
Coordinates | 7210438.cif |
---|---|
Original paper (by DOI) | HTML |
Formula | C21 H12 Cl N O S |
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Calculated formula | C21 H12 Cl N O S |
SMILES | S1c2c(C3C4=C(OC(/C=3C1)=C\C#N)Cc1ccccc41)cc(Cl)cc2 |
Title of publication | Partially reduced thiochromene based oxathiahelicenes: crystallographic, computational and Hirschfeld surface analyses |
Authors of publication | Kumar, Abhinav; Hüch, Volker; Ram, Vishnu Ji |
Journal of publication | CrystEngComm |
Year of publication | 2013 |
Journal volume | 15 |
Journal issue | 35 |
Pages of publication | 7019 |
a | 16.6265 ± 0.0017 Å |
b | 5.0888 ± 0.0004 Å |
c | 20.302 ± 0.0015 Å |
α | 90° |
β | 103.401 ± 0.008° |
γ | 90° |
Cell volume | 1671 ± 0.3 Å3 |
Cell temperature | 153 ± 2 K |
Ambient diffraction temperature | 153 ± 2 K |
Number of distinct elements | 6 |
Space group number | 14 |
Hermann-Mauguin space group symbol | P 1 21/c 1 |
Hall space group symbol | -P 2ybc |
Residual factor for all reflections | 0.1899 |
Residual factor for significantly intense reflections | 0.0589 |
Weighted residual factors for significantly intense reflections | 0.1003 |
Weighted residual factors for all reflections included in the refinement | 0.1357 |
Goodness-of-fit parameter for all reflections included in the refinement | 0.966 |
Diffraction radiation wavelength | 0.71073 Å |
Diffraction radiation type | MoKα |
Has coordinates | Yes |
Has disorder | No |
Has Fobs | No |
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The link is: https://www.crystallography.net/7210438.html
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