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Information card for entry 7210590
Preview
| Coordinates | 7210590.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Formula | C24 H22 Cl2 Cu2 N8 O12 |
|---|---|
| Calculated formula | C24 H22 Cl2 Cu2 N8 O12 |
| SMILES | [Cu]12([n]3c(C(N)=[O]2)cccc3)[n]2c(cccc2)C(=O)N1.[O-]Cl(=O)(=O)=O |
| Title of publication | Can self-assembly of copper(ii) picolinamide building blocks be controlled? |
| Authors of publication | Đaković, Marijana; Vila-Viçosa, Diogo; Bandeira, Nuno A. G.; Calhorda, Maria José; Kozlevčar, Bojan; Jagličić, Zvonko; Popović, Zora |
| Journal of publication | CrystEngComm |
| Year of publication | 2013 |
| Journal volume | 15 |
| Journal issue | 40 |
| Pages of publication | 8074 |
| a | 24.077 ± 0.0005 Å |
| b | 6.552 ± 0.0001 Å |
| c | 19.6808 ± 0.0005 Å |
| α | 90° |
| β | 102.133 ± 0.002° |
| γ | 90° |
| Cell volume | 3035.34 ± 0.11 Å3 |
| Cell temperature | 296 K |
| Ambient diffraction temperature | 296 K |
| Number of distinct elements | 6 |
| Space group number | 15 |
| Hermann-Mauguin space group symbol | C 1 2/c 1 |
| Hall space group symbol | -C 2yc |
| Residual factor for all reflections | 0.0397 |
| Residual factor for significantly intense reflections | 0.0288 |
| Weighted residual factors for significantly intense reflections | 0.0742 |
| Weighted residual factors for all reflections included in the refinement | 0.0764 |
| Goodness-of-fit parameter for all reflections included in the refinement | 0.944 |
| Diffraction radiation probe | x-ray |
| Diffraction radiation wavelength | 0.71073 Å |
| Diffraction radiation type | MoKα |
| Has coordinates | Yes |
| Has disorder | No |
| Has Fobs | No |
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