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Information card for entry 7212124
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Coordinates | 7212124.cif |
---|---|
Original paper (by DOI) | HTML |
Formula | C34 H34 O2 |
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Calculated formula | C34 H34 O2 |
SMILES | C1([O-])=C(C(=O)[C+]1c1cc(C)c2c1c(C)ccc(c2)C(C)C)c1cc(C)c2c1c(C)ccc(c2)C(C)C |
Title of publication | Ambipolar organic transistors and near-infrared phototransistors based on a solution-processable squarilium dye |
Authors of publication | Wöbkenberg, Paul H.; Labram, John G.; Swiecicki, Jean-Marie; Parkhomenko, Ksenia; Sredojevic, Dusan; Gisselbrecht, Jean-Paul; de Leeuw, Dago M.; Bradley, Donal D. C.; Djukic, Jean-Pierre; Anthopoulos, Thomas D. |
Journal of publication | Journal of Materials Chemistry |
Year of publication | 2010 |
Journal volume | 20 |
Journal issue | 18 |
Pages of publication | 3673 |
a | 9.6702 ± 0.0006 Å |
b | 14.2059 ± 0.001 Å |
c | 11.0365 ± 0.0007 Å |
α | 90° |
β | 123.306 ± 0.004° |
γ | 90° |
Cell volume | 1267.1 ± 0.15 Å3 |
Cell temperature | 173 ± 2 K |
Ambient diffraction temperature | 173 ± 2 K |
Number of distinct elements | 3 |
Space group number | 14 |
Hermann-Mauguin space group symbol | P 1 21/c 1 |
Hall space group symbol | -P 2ybc |
Residual factor for all reflections | 0.1014 |
Residual factor for significantly intense reflections | 0.056 |
Weighted residual factors for significantly intense reflections | 0.1198 |
Weighted residual factors for all reflections included in the refinement | 0.1373 |
Goodness-of-fit parameter for all reflections included in the refinement | 1.017 |
Diffraction radiation wavelength | 0.71073 Å |
Diffraction radiation type | MoKα |
Has coordinates | Yes |
Has disorder | No |
Has Fobs | No |
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The link is: https://www.crystallography.net/7212124.html
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Users of the data should acknowledge the original authors of the
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