Crystallography Open Database
- COD Home
- Accessing COD Data
- Add Your Data
- Documentation
Information card for entry 7212191
Preview
Coordinates | 7212191.cif |
---|---|
Original paper (by DOI) | HTML |
Formula | C38 H48 Eu2 N4 O12 |
---|---|
Calculated formula | C38 H48 Eu2 N4 O12 |
SMILES | [Eu]1234([n]5c6c7[n](ccc[n]47)[Eu]478([n]6ccc5)(OC(=CC(C)=[O]4)C)([O]=C(C)C=C(O7)C)OC(=CC(=[O]8)C)C)(OC(=CC(=[O]1)C)C)([O]=C(C)C=C(O2)C)OC(=CC(=[O]3)C)C |
Title of publication | White electroluminescence of lanthanide complexes resulting from exciplex formation |
Authors of publication | Zucchi, Gaël; Jeon, Taewoo; Tondelier, Denis; Aldakov, Dmitry; Thuéry, Pierre; Ephritikhine, Michel; Geffroy, Bernard |
Journal of publication | Journal of Materials Chemistry |
Year of publication | 2010 |
Journal volume | 20 |
Journal issue | 11 |
Pages of publication | 2114 |
a | 9.229 ± 0.0004 Å |
b | 9.8631 ± 0.0005 Å |
c | 12.4794 ± 0.0006 Å |
α | 107.066 ± 0.002° |
β | 97.152 ± 0.003° |
γ | 96.245 ± 0.003° |
Cell volume | 1064.77 ± 0.09 Å3 |
Cell temperature | 100 ± 2 K |
Ambient diffraction temperature | 100 ± 2 K |
Number of distinct elements | 5 |
Space group number | 2 |
Hermann-Mauguin space group symbol | P -1 |
Hall space group symbol | -P 1 |
Residual factor for all reflections | 0.0174 |
Residual factor for significantly intense reflections | 0.0155 |
Weighted residual factors for significantly intense reflections | 0.0363 |
Weighted residual factors for all reflections included in the refinement | 0.0367 |
Goodness-of-fit parameter for all reflections included in the refinement | 1.066 |
Diffraction radiation wavelength | 0.71073 Å |
Diffraction radiation type | MoKα |
Has coordinates | Yes |
Has disorder | No |
Has Fobs | No |
For the version history of this entry, please navigate to main COD server.
The link is: https://www.crystallography.net/7212191.html
All data in the COD and the database itself are dedicated to the
public domain and licensed under the
CC0
License
.
Users of the data should acknowledge the original authors of the
structural data.