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Information card for entry 7212193
Preview
Coordinates | 7212193.cif |
---|---|
Original paper (by DOI) | HTML |
Formula | C38 H48 N4 O12 Sm2 |
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Calculated formula | C38 H48 N4 O12 Sm2 |
SMILES | [n]12[Sm]345(OC(=CC(=[O]3)C)C)(OC(=CC(=[O]4)C)C)(OC(=CC(=[O]5)C)C)[n]3c4c1[n](ccc2)[Sm]125([n]4ccc3)(OC(=CC(C)=[O]1)C)(OC(=CC(=[O]2)C)C)OC(=CC(=[O]5)C)C |
Title of publication | White electroluminescence of lanthanide complexes resulting from exciplex formation |
Authors of publication | Zucchi, Gaël; Jeon, Taewoo; Tondelier, Denis; Aldakov, Dmitry; Thuéry, Pierre; Ephritikhine, Michel; Geffroy, Bernard |
Journal of publication | Journal of Materials Chemistry |
Year of publication | 2010 |
Journal volume | 20 |
Journal issue | 11 |
Pages of publication | 2114 |
a | 9.2497 ± 0.0007 Å |
b | 9.9437 ± 0.001 Å |
c | 12.4584 ± 0.0013 Å |
α | 107.516 ± 0.005° |
β | 96.94 ± 0.006° |
γ | 95.639 ± 0.006° |
Cell volume | 1073.71 ± 0.18 Å3 |
Cell temperature | 100 ± 2 K |
Ambient diffraction temperature | 100 ± 2 K |
Number of distinct elements | 5 |
Space group number | 2 |
Hermann-Mauguin space group symbol | P -1 |
Hall space group symbol | -P 1 |
Residual factor for all reflections | 0.0403 |
Residual factor for significantly intense reflections | 0.0331 |
Weighted residual factors for significantly intense reflections | 0.0736 |
Weighted residual factors for all reflections included in the refinement | 0.0761 |
Goodness-of-fit parameter for all reflections included in the refinement | 1.011 |
Diffraction radiation wavelength | 0.71073 Å |
Diffraction radiation type | MoKα |
Has coordinates | Yes |
Has disorder | No |
Has Fobs | No |
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The link is: https://www.crystallography.net/7212193.html
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