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Information card for entry 7212234
Preview
Coordinates | 7212234.cif |
---|---|
Original paper (by DOI) | HTML |
Formula | C49 H60 Br Cu2 K N4 O9 |
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Calculated formula | C49 H60 Br Cu2 K N4 O9 |
SMILES | [Cu]123[N]4=Cc5c6c([O]([K]789%10([O]26)([O]3c2c([O]7CC)cccc2C=[N]1[C@H]1[C@H]4CCCC1)[O](CC)c1c2[O]8[Cu]34[N](=Cc2ccc1)[C@@H]1CCCC[C@H]1[N]3=Cc1c(c([O]%10CC)ccc1)[O]94)CC)ccc5.[Br-].OC |
Title of publication | Host‒guest chemistry of a chiral Schiff base copper(ii) complex: can chiral information be transferred to the guest cation? |
Authors of publication | Constable, Edwin C.; Zhang, Guoqi; Housecroft, Catherine E.; Neuburger, Markus; Zampese, Jennifer A. |
Journal of publication | CrystEngComm |
Year of publication | 2010 |
Journal volume | 12 |
Journal issue | 6 |
Pages of publication | 1764 |
a | 10.035 ± 0.002 Å |
b | 21.349 ± 0.004 Å |
c | 11.489 ± 0.002 Å |
α | 90° |
β | 105.67 ± 0.03° |
γ | 90° |
Cell volume | 2369.9 ± 0.8 Å3 |
Cell temperature | 173 ± 2 K |
Ambient diffraction temperature | 173 ± 2 K |
Number of distinct elements | 7 |
Space group number | 4 |
Hermann-Mauguin space group symbol | P 1 21 1 |
Hall space group symbol | P 2yb |
Residual factor for all reflections | 0.0482 |
Residual factor for significantly intense reflections | 0.0475 |
Weighted residual factors for significantly intense reflections | 0.1195 |
Weighted residual factors for all reflections included in the refinement | 0.1204 |
Goodness-of-fit parameter for all reflections included in the refinement | 1.06 |
Diffraction radiation wavelength | 0.71073 Å |
Diffraction radiation type | MoKα |
Has coordinates | Yes |
Has disorder | No |
Has Fobs | No |
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The link is: https://www.crystallography.net/7212234.html
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