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Information card for entry 7212330
Preview
| Coordinates | 7212330.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Formula | C8 H17 O Re S4 |
|---|---|
| Calculated formula | C8 H17 O Re S4 |
| SMILES | [Re]12(SCC)([S](CCS2)CC(S1)(C)C)=O |
| Title of publication | Chiral oxorhenium(V) complexes as candidates for the experimental observation of molecular parity violation: a structural, synthetic and theoretical study. |
| Authors of publication | De Montigny, Frederic; Bast, Radovan; Gomes, Andre Severo Pereira; Pilet, Guillaume; Vanthuyne, Nicolas; Roussel, Christian; Guy, Laure; Schwerdtfeger, Peter; Saue, Trond; Crassous, Jeanne |
| Journal of publication | Physical chemistry chemical physics : PCCP |
| Year of publication | 2010 |
| Journal volume | 12 |
| Journal issue | 31 |
| Pages of publication | 8792 - 8803 |
| a | 8.1147 ± 0.0003 Å |
| b | 10.5897 ± 0.0004 Å |
| c | 16.4388 ± 0.0005 Å |
| α | 90° |
| β | 90° |
| γ | 90° |
| Cell volume | 1412.62 ± 0.09 Å3 |
| Cell temperature | 293 K |
| Ambient diffraction temperature | 293 K |
| Number of distinct elements | 5 |
| Space group number | 19 |
| Hermann-Mauguin space group symbol | P 21 21 21 |
| Hall space group symbol | P 2ac 2ab |
| Residual factor for all reflections | 0.0555 |
| Residual factor for significantly intense reflections | 0.0325 |
| Weighted residual factors for all reflections | 0.0469 |
| Weighted residual factors for significantly intense reflections | 0.029 |
| Weighted residual factors for all reflections included in the refinement | 0.029 |
| Goodness-of-fit parameter for all reflections included in the refinement | 1.096 |
| Diffraction radiation wavelength | 0.71073 Å |
| Diffraction radiation type | MoKα |
| Has coordinates | Yes |
| Has disorder | No |
| Has Fobs | No |
For the version history of this entry, please navigate to main COD server.
The link is: https://www.crystallography.net/7212330.html
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Users of the data should acknowledge the original authors of the
structural data.