Information card for entry 7212744
| Formula |
C21 H21 As I2 |
| Calculated formula |
C21 H21 As I2 |
| SMILES |
c1(c(cccc1)C)[As](c1c(cccc1)C)(c1c(cccc1)C)[I]I |
| Title of publication |
Structural relationships between o-, m- and p-tolyl substituted R3EI2 (E = As, P) and [(R3E)AuX] (E = As, P; X = Cl, Br, I) |
| Authors of publication |
Barnes, Nicholas A.; Flower, Kevin R.; Godfrey, Stephen M.; Hurst, Paul A.; Khan, Rana Z.; Pritchard, Robin G. |
| Journal of publication |
CrystEngComm |
| Year of publication |
2010 |
| Journal volume |
12 |
| Journal issue |
12 |
| Pages of publication |
4240 |
| a |
9.2609 ± 0.0002 Å |
| b |
11.1853 ± 0.0003 Å |
| c |
11.6126 ± 0.0003 Å |
| α |
61.935 ± 0.001° |
| β |
89.574 ± 0.001° |
| γ |
88.945 ± 0.002° |
| Cell volume |
1061.28 ± 0.05 Å3 |
| Cell temperature |
100 ± 2 K |
| Ambient diffraction temperature |
100 ± 2 K |
| Number of distinct elements |
4 |
| Space group number |
2 |
| Hermann-Mauguin space group symbol |
P -1 |
| Hall space group symbol |
-P 1 |
| Residual factor for all reflections |
0.097 |
| Residual factor for significantly intense reflections |
0.0673 |
| Weighted residual factors for significantly intense reflections |
0.1538 |
| Weighted residual factors for all reflections included in the refinement |
0.1791 |
| Goodness-of-fit parameter for all reflections included in the refinement |
1.143 |
| Diffraction radiation probe |
x-ray |
| Diffraction radiation wavelength |
0.71073 Å |
| Diffraction radiation type |
MoKα |
| Has coordinates |
Yes |
| Has disorder |
No |
| Has Fobs |
No |
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https://www.crystallography.net/7212744.html