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Information card for entry 7212818
Preview
Coordinates | 7212818.cif |
---|---|
Original paper (by DOI) | HTML |
Formula | C20 H22 Cu F6 K N2 O4 P |
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Calculated formula | C20 H22 Cu F6 K N2 O4 P |
SMILES | [Cu]123[O]4[K]56[O](CC)c7c4c(C=[N]2CC[N]3=Cc2cccc(c2[O]15)[O]6CC)ccc7.[P](F)(F)(F)(F)(F)[F-] |
Title of publication | Tetrametallic [2 ×1 + 1 ×2], octametallic double-decker‒triple-decker [5 ×1 + 3 ×1], hexametallic quadruple-decker and dimetallic-based one-dimensional complexes of copper(ii) and s block metal ions derived from N,N′-ethylenebis(3-ethoxysalicylaldimine) |
Authors of publication | Sasmal, Sujit; Majumder, Samit; Hazra, Susanta; Sparkes, Hazel A.; Howard, Judith A. K.; Nayak, Malabika; Mohanta, Sasankasekhar |
Journal of publication | CrystEngComm |
Year of publication | 2010 |
Journal volume | 12 |
Journal issue | 12 |
Pages of publication | 4131 |
a | 7.1687 ± 0.0002 Å |
b | 13.7862 ± 0.0004 Å |
c | 23.3747 ± 0.0006 Å |
α | 90° |
β | 90° |
γ | 90° |
Cell volume | 2310.1 ± 0.11 Å3 |
Cell temperature | 120 ± 2 K |
Ambient diffraction temperature | 120 ± 2 K |
Number of distinct elements | 8 |
Space group number | 19 |
Hermann-Mauguin space group symbol | P 21 21 21 |
Hall space group symbol | P 2ac 2ab |
Residual factor for all reflections | 0.0477 |
Residual factor for significantly intense reflections | 0.0337 |
Weighted residual factors for significantly intense reflections | 0.0552 |
Weighted residual factors for all reflections included in the refinement | 0.0569 |
Goodness-of-fit parameter for all reflections included in the refinement | 0.865 |
Diffraction radiation wavelength | 0.71073 Å |
Diffraction radiation type | MoKα |
Has coordinates | Yes |
Has disorder | No |
Has Fobs | No |
For the version history of this entry, please navigate to main COD server.
The link is: https://www.crystallography.net/7212818.html
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Users of the data should acknowledge the original authors of the
structural data.