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Information card for entry 7212955
Preview
Coordinates | 7212955.cif |
---|---|
Original paper (by DOI) | HTML |
Formula | C22 H16 Ag N2 S8 Se8 |
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Calculated formula | C22 H16 Ag N2 S8 Se8 |
SMILES | C1SC2=C(SC1)[Se]C([Se]2)=C1[Se]C2=C(SCCS2)[Se]1.C1SC2=C(SC1)[Se]C([Se]2)=C1[Se]C2=C(SCCS2)[Se]1.[Ag](C#N)C#N |
Title of publication | Preparation, crystal structures, EHT band calculations and physical properties of κ-(EDS-EDT-TTF)2[Ag2(CN)3] and α-(BETS)2Ag(CN)2 |
Authors of publication | Golhen, Stéphane; Ouahab, Lahcène; Lebeuze, Albert; Bouayed, Mounir; Delhaes, Pierre; Kashimura, Yoshiaki; Kato, Reizo; Binet, Laurent; Fabre, Jean-Marc |
Journal of publication | Journal of Materials Chemistry |
Year of publication | 1999 |
Journal volume | 9 |
Journal issue | 2 |
Pages of publication | 387 |
a | 9.5839 ± 0.0008 Å |
b | 4.983 ± 0.003 Å |
c | 34.645 ± 0.006 Å |
α | 90° |
β | 90° |
γ | 90° |
Cell volume | 1654.5 ± 1 Å3 |
Cell temperature | 293 ± 2 K |
Ambient diffraction temperature | 293 ± 2 K |
Number of distinct elements | 6 |
Space group number | 18 |
Hermann-Mauguin space group symbol | P 21 21 2 |
Hall space group symbol | P 2 2ab |
Residual factor for all reflections | 0.2658 |
Residual factor for significantly intense reflections | 0.057 |
Weighted residual factors for significantly intense reflections | 0.1158 |
Weighted residual factors for all reflections included in the refinement | 0.1738 |
Goodness-of-fit parameter for all reflections included in the refinement | 0.926 |
Diffraction radiation wavelength | 0.71073 Å |
Diffraction radiation type | MoKα |
Has coordinates | Yes |
Has disorder | No |
Has Fobs | No |
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