Crystallography Open Database
- COD Home
- Accessing COD Data
- Add Your Data
- Documentation
Information card for entry 7212962
Preview
Coordinates | 7212962.cif |
---|---|
Original paper (by DOI) | HTML |
Formula | C36 H38 N14 Ni |
---|---|
Calculated formula | C36 H38 N14 Ni |
SMILES | C1C[NH]2[Ni]345([NH]6CC[NH]3CC[NH]5CC6)[NH]1CC[NH]4CC2.C1(C=CC(C=C1)=C(C#N)C#N)=C(C#N)C#N.C1(C=CC(C=C1)=C(C#N)C#N)=C(C#N)C#N |
Title of publication | Structural, magnetic, electrical and optical characterization of systems built from [M([9]aneN3)2]2+ (M=CuII or NiII) and TCNQ or TCNQF4 |
Authors of publication | Azcondo, M. Teresa; Ballester, Loreto; Golhen, Stephane; Gutierrez, Angel; Ouahab, Lahcene; Yartsev, Slav; Delhaes, Pierre |
Journal of publication | Journal of Materials Chemistry |
Year of publication | 1999 |
Journal volume | 9 |
Journal issue | 6 |
Pages of publication | 1237 |
a | 8.6488 ± 0.0009 Å |
b | 8.919 ± 0.003 Å |
c | 11.316 ± 0.002 Å |
α | 82.06 ± 0.02° |
β | 74.331 ± 0.01° |
γ | 85.71 ± 0.02° |
Cell volume | 831.8 ± 0.3 Å3 |
Cell temperature | 293 ± 2 K |
Ambient diffraction temperature | 293 ± 2 K |
Number of distinct elements | 4 |
Space group number | 2 |
Hermann-Mauguin space group symbol | P -1 |
Hall space group symbol | -P 1 |
Residual factor for all reflections | 0.0853 |
Residual factor for significantly intense reflections | 0.0551 |
Weighted residual factors for all reflections | 0.1601 |
Weighted residual factors for significantly intense reflections | 0.1423 |
Goodness-of-fit parameter for all reflections | 1.058 |
Goodness-of-fit parameter for significantly intense reflections | 1.066 |
Diffraction radiation wavelength | 0.71073 Å |
Diffraction radiation type | MoKα |
Has coordinates | Yes |
Has disorder | No |
Has Fobs | No |
For the version history of this entry, please navigate to main COD server.
The link is: https://www.crystallography.net/7212962.html
All data in the COD and the database itself are dedicated to the
public domain and licensed under the
CC0
License
.
Users of the data should acknowledge the original authors of the
structural data.