Crystallography Open Database
- COD Home
- Accessing COD Data
- Add Your Data
- Documentation
Information card for entry 7213360
Preview
Coordinates | 7213360.cif |
---|---|
Original paper (by DOI) | HTML |
Chemical name | Tetra-(4-chlorophenyl)ethene p-xylene inclusion compound (3.pXy) |
---|---|
Formula | C34 H26 Cl4 |
Calculated formula | C34 H26 Cl4 |
SMILES | Clc1ccc(C(=C(c2ccc(Cl)cc2)c2ccc(Cl)cc2)c2ccc(Cl)cc2)cc1.c1(ccc(cc1)C)C |
Title of publication | Chiral inclusion crystallization of achiral tetrakis( p-halophenyl)ethylenes with achiral guest compounds |
Authors of publication | Tanaka, Koichi; Fujimoto, Daisuke; Altreuther, A.; Oeser, Thomas; Irngartinger, Hermann; Toda, Fumio |
Journal of publication | Journal of the Chemical Society, Perkin Transactions 2 |
Year of publication | 2000 |
Journal issue | 10 |
Pages of publication | 2115 |
a | 8.635 ± 0.002 Å |
b | 14.707 ± 0.004 Å |
c | 22.891 ± 0.012 Å |
α | 90° |
β | 90° |
γ | 90° |
Cell volume | 2907 ± 1.8 Å3 |
Cell temperature | 173 ± 2 K |
Ambient diffraction temperature | 173 ± 2 K |
Number of distinct elements | 3 |
Space group number | 19 |
Hermann-Mauguin space group symbol | P 21 21 21 |
Hall space group symbol | P 2ac 2ab |
Residual factor for all reflections | 0.094 |
Residual factor for significantly intense reflections | 0.034 |
Weighted residual factors for significantly intense reflections | 0.071 |
Weighted residual factors for all reflections included in the refinement | 0.084 |
Goodness-of-fit parameter for all reflections included in the refinement | 1.037 |
Diffraction radiation wavelength | 0.71073 Å |
Diffraction radiation type | MoKα |
Has coordinates | Yes |
Has disorder | No |
Has Fobs | No |
For the version history of this entry, please navigate to main COD server.
The link is: https://www.crystallography.net/7213360.html
All data in the COD and the database itself are dedicated to the
public domain and licensed under the
CC0
License
.
Users of the data should acknowledge the original authors of the
structural data.