Information card for entry 7214092
| Chemical name |
TW-6-15 2,3,5,6-Me4-pyridine-1,4-dioxide, (1,3,5-F3-2,4,6-I3-benzene)2 |
| Formula |
C20 H12 F6 I6 N2 O2 |
| Calculated formula |
C20 H12 F6 I6 N2 O2 |
| SMILES |
c1(c(c(c(c(c1F)I)F)I)F)I.n1(=O)c(c(C)n(c(c1C)C)=O)C.c1(c(c(c(c(c1F)I)F)I)F)I |
| Title of publication |
Constructing molecular polygons using halogen bonding and bifurcated N-oxides |
| Authors of publication |
Aakeröy, Christer B.; Wijethunga, Tharanga K.; Desper, John |
| Journal of publication |
CrystEngComm |
| Year of publication |
2014 |
| Journal volume |
16 |
| Journal issue |
1 |
| Pages of publication |
28 |
| a |
7.966 ± 0.0006 Å |
| b |
9.2821 ± 0.0007 Å |
| c |
10.1097 ± 0.0008 Å |
| α |
100.812 ± 0.003° |
| β |
106.262 ± 0.002° |
| γ |
95.408 ± 0.003° |
| Cell volume |
696.29 ± 0.09 Å3 |
| Cell temperature |
120 ± 2 K |
| Ambient diffraction temperature |
120 ± 2 K |
| Number of distinct elements |
6 |
| Space group number |
2 |
| Hermann-Mauguin space group symbol |
P -1 |
| Hall space group symbol |
-P 1 |
| Residual factor for all reflections |
0.022 |
| Residual factor for significantly intense reflections |
0.0204 |
| Weighted residual factors for significantly intense reflections |
0.0522 |
| Weighted residual factors for all reflections included in the refinement |
0.053 |
| Goodness-of-fit parameter for all reflections included in the refinement |
1.133 |
| Diffraction radiation wavelength |
0.71073 Å |
| Diffraction radiation type |
MoKα |
| Has coordinates |
Yes |
| Has disorder |
No |
| Has Fobs |
No |
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https://www.crystallography.net/7214092.html