Information card for entry 7215090
| Formula |
C50 H38 Si |
| Calculated formula |
C50 H38 Si |
| Title of publication |
Naphthalene-substituted 2,3,4,5-tetraphenylsiloles: synthesis, structure, aggregation-induced emission and efficient electroluminescence |
| Authors of publication |
Jiang, Tao; Jiang, Yibing; Qin, Wei; Chen, Shuming; Lu, Yahong; Lam, Jacky W. Y.; He, Bairong; Lu, Ping; Sung, Herman H. Y.; Williams, Ian D.; Kwok, Hoi Sing; Zhao, Zujin; Qiu, Huayu; Tang, Ben Zhong |
| Journal of publication |
Journal of Materials Chemistry |
| Year of publication |
2012 |
| Journal volume |
22 |
| Journal issue |
38 |
| Pages of publication |
20266 |
| a |
25.5955 ± 0.0003 Å |
| b |
10.439 ± 0.0001 Å |
| c |
13.5467 ± 0.0001 Å |
| α |
90° |
| β |
90.954 ± 0.001° |
| γ |
90° |
| Cell volume |
3619.06 ± 0.06 Å3 |
| Cell temperature |
173 ± 0.14 K |
| Ambient diffraction temperature |
173 ± 0.14 K |
| Number of distinct elements |
3 |
| Space group number |
13 |
| Hermann-Mauguin space group symbol |
P 1 2/c 1 |
| Hall space group symbol |
-P 2yc |
| Residual factor for all reflections |
0.0421 |
| Residual factor for significantly intense reflections |
0.0363 |
| Weighted residual factors for significantly intense reflections |
0.1002 |
| Weighted residual factors for all reflections included in the refinement |
0.1041 |
| Goodness-of-fit parameter for all reflections included in the refinement |
1.013 |
| Diffraction radiation probe |
x-ray |
| Diffraction radiation wavelength |
1.5418 Å |
| Diffraction radiation type |
CuKα |
| Has coordinates |
Yes |
| Has disorder |
No |
| Has Fobs |
No |
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