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Information card for entry 7215141
Preview
| Coordinates | 7215141.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Common name | germanium antimony telluride |
|---|---|
| Formula | Ge1.876 Sb2.039 Te5 |
| Calculated formula | Ge1.86 Sb2.04 Te5 |
| Title of publication | Temperature dependent resonant X-ray diffraction of single-crystalline Ge2Sb2Te5 |
| Authors of publication | Urban, Philipp; Schneider, Matthias N.; Erra, Loredana; Welzmiller, Simon; Fahrnbauer, Felix; Oeckler, Oliver |
| Journal of publication | CrystEngComm |
| Year of publication | 2013 |
| Journal volume | 15 |
| Journal issue | 24 |
| Pages of publication | 4823 |
| a | 4.2257 ± 0.0002 Å |
| b | 4.2257 ± 0.0002 Å |
| c | 17.2809 ± 0.0018 Å |
| α | 90° |
| β | 90° |
| γ | 120° |
| Cell volume | 267.24 ± 0.03 Å3 |
| Cell temperature | 293 ± 2 K |
| Ambient diffraction temperature | 293 ± 2 K |
| Number of distinct elements | 3 |
| Space group number | 164 |
| Hermann-Mauguin space group symbol | P -3 m 1 |
| Hall space group symbol | -P 3 2" |
| Residual factor for all reflections | 0.0371 |
| Residual factor for significantly intense reflections | 0.0275 |
| Weighted residual factors for significantly intense reflections | 0.0324 |
| Weighted residual factors for all reflections included in the refinement | 0.0334 |
| Goodness-of-fit parameter for significantly intense reflections | 1.43 |
| Goodness-of-fit parameter for all reflections included in the refinement | 1.28 |
| Diffraction radiation probe | x-ray |
| Diffraction radiation wavelength | 0.40681 Å |
| Diffraction radiation type | synchrotron |
| Has coordinates | Yes |
| Has disorder | No |
| Has Fobs | No |
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