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Information card for entry 7215495
Preview
Coordinates | 7215495.cif |
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Original paper (by DOI) | HTML |
Formula | C30 H36 O2 S5 |
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Calculated formula | C30 H36 O2 S5 |
SMILES | s1c(c(c2S(=O)(=O)c3c(sc(c4sc(CCCCCC)cc4)c3C)c12)C)c1sc(CCCCCC)cc1 |
Title of publication | Influence of the oxidation level on the electronic, morphological and charge transport properties of novel dithienothiophene S-oxide and S,S-dioxide inner core oligomers |
Authors of publication | Santato, Clara; Favaretto, Laura; Melucci, Manuela; Zanelli, Alberto; Gazzano, Massimo; Monari, Magda; Isik, Dilek; Banville, David; Bertolazzi, Simone; Loranger, Sébastien; Cicoira, Fabio |
Journal of publication | Journal of Materials Chemistry |
Year of publication | 2010 |
Journal volume | 20 |
Journal issue | 4 |
Pages of publication | 669 |
a | 9.2754 ± 0.0015 Å |
b | 11.6067 ± 0.0019 Å |
c | 14.374 ± 0.002 Å |
α | 80.407 ± 0.002° |
β | 87.018 ± 0.002° |
γ | 88.813 ± 0.002° |
Cell volume | 1523.6 ± 0.4 Å3 |
Cell temperature | 296 ± 2 K |
Ambient diffraction temperature | 296 ± 2 K |
Number of distinct elements | 4 |
Space group number | 2 |
Hermann-Mauguin space group symbol | P -1 |
Hall space group symbol | -P 1 |
Residual factor for all reflections | 0.1439 |
Residual factor for significantly intense reflections | 0.0604 |
Weighted residual factors for significantly intense reflections | 0.1481 |
Weighted residual factors for all reflections included in the refinement | 0.1924 |
Goodness-of-fit parameter for all reflections included in the refinement | 1.003 |
Diffraction radiation wavelength | 0.71073 Å |
Diffraction radiation type | MoKα |
Has coordinates | Yes |
Has disorder | No |
Has Fobs | No |
For the version history of this entry, please navigate to main COD server.
The link is: https://www.crystallography.net/7215495.html
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Users of the data should acknowledge the original authors of the
structural data.