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Information card for entry 7215814
Preview
Coordinates | 7215814.cif |
---|---|
Original paper (by DOI) | HTML |
Formula | C32 H24 F4 N8 O4 |
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Calculated formula | C32 H24 F4 N8 O4 |
SMILES | C1(C(C(F)=C(C(C=1F)=C(C#N)C#N)F)=C(C#N)C#N)F.C1[N+]2(Cc3ccc(N(=O)=O)cc3)CC[N+](Cc3ccc(N(=O)=O)cc3)(C1)CC2 |
Title of publication | Structural and optical investigations of charge transfer complexes involving the F4TCNQ dianion |
Authors of publication | Sutton, Ashley L.; Abrahams, Brendan F.; D'Alessandro, Deanna M.; Elliott, Robert W.; Hudson, Timothy A.; Robson, Richard; Usov, Pavel M. |
Journal of publication | CrystEngComm |
Year of publication | 2014 |
a | 10.2589 ± 0.0002 Å |
b | 12.2242 ± 0.0002 Å |
c | 22.2473 ± 0.0005 Å |
α | 90° |
β | 95.29 ± 0.002° |
γ | 90° |
Cell volume | 2778.08 ± 0.09 Å3 |
Cell temperature | 130 ± 2 K |
Ambient diffraction temperature | 130 ± 2 K |
Number of distinct elements | 5 |
Space group number | 15 |
Hermann-Mauguin space group symbol | C 1 2/c 1 |
Hall space group symbol | -C 2yc |
Residual factor for all reflections | 0.0527 |
Residual factor for significantly intense reflections | 0.0457 |
Weighted residual factors for significantly intense reflections | 0.1267 |
Weighted residual factors for all reflections included in the refinement | 0.132 |
Goodness-of-fit parameter for all reflections included in the refinement | 1.07 |
Diffraction radiation wavelength | 1.5418 Å |
Diffraction radiation type | CuKα |
Has coordinates | Yes |
Has disorder | No |
Has Fobs | No |
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The link is: https://www.crystallography.net/7215814.html
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