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Information card for entry 7215843
Preview
| Coordinates | 7215843.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Formula | C42 H32 Cu2 I2 N2 P2 |
|---|---|
| Calculated formula | C42 H32 Cu2 I2 N2 P2 |
| SMILES | [Cu]123([Cu]4([I]1)([I]2)[P](c1cccc2ccc[n]4c12)(c1ccccc1)c1ccccc1)[P](c1cccc2ccc[n]3c12)(c1ccccc1)c1ccccc1 |
| Title of publication | Structural and photophysical study of copper iodide complex with P^N or P^N^P ligand |
| Authors of publication | Wei, Feng; Liu, Xiaochen; Liu, Zhiwei; Bian, Zuqiang; Zhao, Yongliang; Huang, Chunhui |
| Journal of publication | CrystEngComm |
| Year of publication | 2014 |
| Journal volume | 16 |
| Journal issue | 24 |
| Pages of publication | 5338 |
| a | 38.973 ± 0.008 Å |
| b | 11.992 ± 0.002 Å |
| c | 17.704 ± 0.004 Å |
| α | 90° |
| β | 105.94 ± 0.03° |
| γ | 90° |
| Cell volume | 7956 ± 3 Å3 |
| Cell temperature | 153 ± 2 K |
| Ambient diffraction temperature | 153 ± 2 K |
| Number of distinct elements | 6 |
| Space group number | 15 |
| Hermann-Mauguin space group symbol | C 1 2/c 1 |
| Hall space group symbol | -C 2yc |
| Residual factor for all reflections | 0.0382 |
| Residual factor for significantly intense reflections | 0.0336 |
| Weighted residual factors for significantly intense reflections | 0.0743 |
| Weighted residual factors for all reflections included in the refinement | 0.0761 |
| Goodness-of-fit parameter for all reflections included in the refinement | 1.358 |
| Diffraction radiation wavelength | 0.71073 Å |
| Diffraction radiation type | MoKα |
| Has coordinates | Yes |
| Has disorder | No |
| Has Fobs | No |
For the version history of this entry, please navigate to main COD server.
The link is: https://www.crystallography.net/7215843.html
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