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Information card for entry 7216128
Preview
Coordinates | 7216128.cif |
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Original paper (by DOI) | HTML |
Formula | C8 H8 Cl N O S |
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Calculated formula | C8 H8 Cl N O S |
SMILES | Clc1ccc(NC(=S)OC)cc1 |
Title of publication | Prevalence of the thioamide {⋯H‒N‒CS}2 synthon—solid-state (X-ray crystallography), solution (NMR) and gas-phase (theoretical) structures of O-methyl-N-aryl-thiocarbamides |
Authors of publication | Ho, Soo Yei; Bettens, Ryan P. A.; Dakternieks, Dainis; Duthie, Andrew; Tiekink, Edward R. T. |
Journal of publication | CrystEngComm |
Year of publication | 2005 |
Journal volume | 7 |
Journal issue | 113 |
Pages of publication | 682 |
a | 14.5243 ± 0.001 Å |
b | 7.7142 ± 0.0006 Å |
c | 17.276 ± 0.0012 Å |
α | 90° |
β | 110.56 ± 0.002° |
γ | 90° |
Cell volume | 1812.4 ± 0.2 Å3 |
Cell temperature | 223 ± 2 K |
Ambient diffraction temperature | 223 ± 2 K |
Number of distinct elements | 6 |
Space group number | 14 |
Hermann-Mauguin space group symbol | P 1 21/n 1 |
Hall space group symbol | -P 2yn |
Residual factor for all reflections | 0.062 |
Residual factor for significantly intense reflections | 0.043 |
Weighted residual factors for significantly intense reflections | 0.112 |
Weighted residual factors for all reflections included in the refinement | 0.121 |
Goodness-of-fit parameter for all reflections included in the refinement | 1.04 |
Diffraction radiation wavelength | 0.71069 Å |
Diffraction radiation type | MoKα |
Has coordinates | Yes |
Has disorder | No |
Has Fobs | No |
For the version history of this entry, please navigate to main COD server.
The link is: https://www.crystallography.net/7216128.html
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