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Information card for entry 7217846
Preview
Coordinates | 7217846.cif |
---|---|
Original paper (by DOI) | HTML |
Formula | C29 H46 O4 |
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Calculated formula | C29 H46 O4 |
SMILES | O=C(O[C@H]1CC[C@]2([C@H](C1)CCC1=C3[C@](CC[C@]21O)([C@H](CC3=O)[C@H](C)CCCC(C)C)C)C)C |
Title of publication | Structure ‒ Chiroptical Properties Relationship of Cisoid Enones with α-Methylenecyclopentanone Unit |
Authors of publication | Szczepek, Wojciech Jan; Frelek, Jadwiga; Butkiewicz, Aleksandra; Górecki, Marcin; Wojcieszczyk, Ryszard K.; Luboradzki, Roman; Kwit, Marcin; Rode, Michal F. |
Journal of publication | RSC Advances |
Year of publication | 2014 |
a | 11.405 ± 0.0002 Å |
b | 6.1854 ± 0.0001 Å |
c | 18.2916 ± 0.0003 Å |
α | 90° |
β | 90.461 ± 0.001° |
γ | 90° |
Cell volume | 1290.33 ± 0.04 Å3 |
Cell temperature | 100 ± 0.2 K |
Ambient diffraction temperature | 100 ± 0.2 K |
Number of distinct elements | 3 |
Space group number | 4 |
Hermann-Mauguin space group symbol | P 1 21 1 |
Hall space group symbol | P 2yb |
Residual factor for all reflections | 0.0305 |
Residual factor for significantly intense reflections | 0.0297 |
Weighted residual factors for significantly intense reflections | 0.0761 |
Weighted residual factors for all reflections included in the refinement | 0.077 |
Goodness-of-fit parameter for all reflections included in the refinement | 1.075 |
Diffraction radiation probe | x-ray |
Diffraction radiation wavelength | 1.54184 Å |
Diffraction radiation type | CuKα |
Has coordinates | Yes |
Has disorder | No |
Has Fobs | No |
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The link is: https://www.crystallography.net/7217846.html
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