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Information card for entry 7217975
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Coordinates | 7217975.cif |
---|---|
Original paper (by DOI) | HTML |
Chemical name | Dichlorido(1,2-bis(dimethylphosphino)benzene)germanium(II) |
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Formula | C10 H16 Cl2 Ge P2 |
Calculated formula | C10 H16 Cl2 Ge P2 |
SMILES | [Ge]1(Cl)(Cl)[P](C)(C)c2ccccc2[P]1(C)C |
Title of publication | Exploring secondary bonding in p-block chemistry ‒ an experimental study of [GeX2{o-C6H4(PMe2)2}] using variable pressure single crystal X-ray diffraction |
Authors of publication | Allan, David R.; Coles, Simon J.; George, Kathryn; Jura, Marek; Levason, William; Reid, Gillian; Wilson, Claire; Zhang, Wenjian |
Journal of publication | CrystEngComm |
Year of publication | 2014 |
Journal volume | 16 |
Journal issue | 35 |
Pages of publication | 8169 |
a | 26.73 ± 0.04 Å |
b | 6.863 ± 0.008 Å |
c | 13.068 ± 0.018 Å |
α | 90° |
β | 110.22 ± 0.07° |
γ | 90° |
Cell volume | 2250 ± 5 Å3 |
Cell temperature | 293 ± 2 K |
Ambient diffraction temperature | 293 ± 2 K |
Cell measurement pressure | 4800000 kPa |
Ambient diffracton pressure | 4800000 kPa |
Number of distinct elements | 5 |
Space group number | 15 |
Hermann-Mauguin space group symbol | C 1 2/c 1 |
Hall space group symbol | -C 2yc |
Residual factor for all reflections | 0.1416 |
Residual factor for significantly intense reflections | 0.0938 |
Weighted residual factors for significantly intense reflections | 0.1526 |
Weighted residual factors for all reflections included in the refinement | 0.1784 |
Goodness-of-fit parameter for all reflections included in the refinement | 1.126 |
Diffraction radiation wavelength | 0.4859 Å |
Diffraction radiation type | Synchrotron |
Has coordinates | Yes |
Has disorder | No |
Has Fobs | No |
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