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Information card for entry 7219020
Preview
Coordinates | 7219020.cif |
---|---|
Original paper (by DOI) | HTML |
Formula | C42 H56 O10 |
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Calculated formula | C42 H56 O10 |
SMILES | Oc1c2cc(c(O)c1C)C(CC)c1c(O)c(c(O)c(c1)C(CC)c1c(O)c(c(O)c(c1)C(CC)c1c(O)c(c(O)c(c1)C2CC)C)C)C.OC.OC |
Title of publication | Encapsulation of secondary and tertiary ammonium salts by resorcinarenes and pyrogallarenes: the effect of size and charge concentration |
Authors of publication | Beyeh, N. K.; Pan, F.; Valkonen, A.; Rissanen, K. |
Journal of publication | CrystEngComm |
Year of publication | 2015 |
Journal volume | 17 |
Journal issue | 5 |
Pages of publication | 1182 |
a | 12.1523 ± 0.0017 Å |
b | 12.5597 ± 0.0019 Å |
c | 14.3332 ± 0.0014 Å |
α | 104.789 ± 0.011° |
β | 102.134 ± 0.01° |
γ | 107.641 ± 0.013° |
Cell volume | 1915 ± 0.5 Å3 |
Cell temperature | 173 ± 2 K |
Ambient diffraction temperature | 173.15 K |
Number of distinct elements | 3 |
Space group number | 2 |
Hermann-Mauguin space group symbol | P -1 |
Hall space group symbol | -P 1 |
Residual factor for all reflections | 0.0937 |
Residual factor for significantly intense reflections | 0.0631 |
Weighted residual factors for significantly intense reflections | 0.1449 |
Weighted residual factors for all reflections included in the refinement | 0.1768 |
Goodness-of-fit parameter for all reflections included in the refinement | 1.082 |
Diffraction radiation wavelength | 0.71073 Å |
Diffraction radiation type | MoKα |
Has coordinates | Yes |
Has disorder | No |
Has Fobs | No |
For the version history of this entry, please navigate to main COD server.
The link is: https://www.crystallography.net/7219020.html
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Users of the data should acknowledge the original authors of the
structural data.