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Information card for entry 7219574
Preview
Coordinates | 7219574.cif |
---|---|
Original paper (by DOI) | HTML |
Formula | H26.66667 N6 O1.33333 S9 Sn3 |
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Calculated formula | H26.6667 N6 O1.33333 S9 Sn3 |
SMILES | O.O.S1[Sn]([S-])([S-])S[Sn]([S-])([S-])S[Sn]1([S-])[S-].[NH4+].[NH4+].[NH4+].[NH4+].[NH4+].[NH4+] |
Title of publication | Expanding the structural versatility of thiostannate(iv) complexes |
Authors of publication | Nørby, Peter; Eikeland, Espen; Overgaard, Jacob; Johnsen, Simon; Iversen, Bo B. |
Journal of publication | CrystEngComm |
Year of publication | 2015 |
Journal volume | 17 |
Journal issue | 11 |
Pages of publication | 2413 |
a | 16.98717 ± 0.00013 Å |
b | 10.54777 ± 0.00007 Å |
c | 21.08715 ± 0.00019 Å |
α | 90° |
β | 108.039 ± 0.0009° |
γ | 90° |
Cell volume | 3592.61 ± 0.05 Å3 |
Cell temperature | 99.97 ± 0.11 K |
Ambient diffraction temperature | 99.97 ± 0.11 K |
Number of distinct elements | 5 |
Space group number | 5 |
Hermann-Mauguin space group symbol | C 1 2 1 |
Hall space group symbol | C 2y |
Residual factor for all reflections | 0.018 |
Residual factor for significantly intense reflections | 0.017 |
Weighted residual factors for significantly intense reflections | 0.0335 |
Weighted residual factors for all reflections included in the refinement | 0.0338 |
Goodness-of-fit parameter for all reflections included in the refinement | 1.025 |
Diffraction radiation wavelength | 0.71073 Å |
Diffraction radiation type | MoKα |
Has coordinates | Yes |
Has disorder | No |
Has Fobs | No |
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The link is: https://www.crystallography.net/7219574.html
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