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Information card for entry 7219747
Preview
| Coordinates | 7219747.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Formula | C36 H26 Cd2 Cl4 N8 |
|---|---|
| Calculated formula | C36 H26 Cd2 Cl4 N8 |
| SMILES | c1cccc2[n]1[Cd]1([n]3c2n2ccccc2c3[C@@H]([C@H]2c3[n]4c(c5cccc[n]5[Cd]4([n]4c2cccc4)(Cl)Cl)n2ccccc32)c2[n]1cccc2)(Cl)Cl |
| Title of publication | A series of temperature-dependent CdII-complexes containing an important family of N-rich heterocycles from in situ conversion of pyridine-type Schiff base |
| Authors of publication | Ou, Yan-Jun; Ding, Yu-Jia; Hong, Xu-Jia; Wei, Qin; Zheng, Zhi-Peng; Long, Yuhua; Cai, Prof. Yue-Peng; Yao, Xiangdong |
| Journal of publication | RSC Adv. |
| Year of publication | 2015 |
| a | 9.617 ± 0.015 Å |
| b | 9.698 ± 0.016 Å |
| c | 10.175 ± 0.016 Å |
| α | 89.54 ± 0.03° |
| β | 79.24 ± 0.02° |
| γ | 86.21 ± 0.03° |
| Cell volume | 930 ± 3 Å3 |
| Cell temperature | 296 ± 2 K |
| Ambient diffraction temperature | 296 ± 2 K |
| Number of distinct elements | 5 |
| Space group number | 2 |
| Hermann-Mauguin space group symbol | P -1 |
| Hall space group symbol | -P 1 |
| Residual factor for all reflections | 0.0832 |
| Residual factor for significantly intense reflections | 0.0592 |
| Weighted residual factors for significantly intense reflections | 0.1445 |
| Weighted residual factors for all reflections included in the refinement | 0.159 |
| Goodness-of-fit parameter for all reflections included in the refinement | 1.017 |
| Diffraction radiation wavelength | 0.71073 Å |
| Diffraction radiation type | MoKα |
| Has coordinates | Yes |
| Has disorder | No |
| Has Fobs | No |
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The link is: https://www.crystallography.net/7219747.html
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