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Information card for entry 7220191
Preview
Coordinates | 7220191.cif |
---|---|
Original paper (by DOI) | HTML |
Formula | C44 H52 Cu4 N4 O16 |
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Calculated formula | C44 H52 Cu4 N4 O16 |
SMILES | c12C=[N]3C[C@H]([O]45[Cu]63(Oc1c(ccc2)OC)[O]12[C@@H](C[N]3=Cc7c(c(ccc7)OC)O[Cu]413[O]13[C@H](C[N]4[Cu]51(Oc1c(cccc1C=4)OC)[O]16[C@H](C[N]4[Cu]231Oc1c(cccc1C=4)OC)CO)CO)CO)CO |
Title of publication | Cubane-type {M4O4} (M = CoII, ZnII, CuII) clusters: synthesis, crystal structures, and luminescent and magnetic properties |
Authors of publication | Gao, Qian; Qin, Yaru; Chen, Yanmei; Liu, Wei; Li, Hai-Yan; Wu, Bing; Li, Yahong; Li, Wu |
Journal of publication | RSC Adv. |
Year of publication | 2015 |
a | 15.4331 ± 0.0019 Å |
b | 15.4331 ± 0.0019 Å |
c | 9.4388 ± 0.0017 Å |
α | 90° |
β | 90° |
γ | 90° |
Cell volume | 2248.1 ± 0.6 Å3 |
Cell temperature | 296 ± 2 K |
Ambient diffraction temperature | 296 ± 2 K |
Number of distinct elements | 5 |
Space group number | 86 |
Hermann-Mauguin space group symbol | P 42/n :2 |
Hall space group symbol | -P 4bc |
Residual factor for all reflections | 0.0451 |
Residual factor for significantly intense reflections | 0.0331 |
Weighted residual factors for significantly intense reflections | 0.0894 |
Weighted residual factors for all reflections included in the refinement | 0.0972 |
Goodness-of-fit parameter for all reflections included in the refinement | 1.045 |
Diffraction radiation wavelength | 0.71073 Å |
Diffraction radiation type | MoKα |
Has coordinates | Yes |
Has disorder | No |
Has Fobs | No |
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