Crystallography Open Database
- COD Home
- Accessing COD Data
- Add Your Data
- Documentation
Information card for entry 7220384
Preview
Coordinates | 7220384.cif |
---|---|
Original paper (by DOI) | HTML |
Formula | C61 H57 Ag N O2 P3 Se |
---|---|
Calculated formula | C61 H57 Ag N O2 P3 Se |
SMILES | [Ag]([Se]c1ccncc1)([P](c1ccccc1)(c1ccccc1)c1ccccc1)([P](c1ccccc1)(c1ccccc1)c1ccccc1)[P](c1ccccc1)(c1ccccc1)c1ccccc1.OC.OC |
Title of publication | Hemilabile silver(i) complexes containing pyridyl chalcogenolate (S, Se) ligands and their utility as molecular precursors for silver chalcogenides |
Authors of publication | Kole, Goutam Kumar; Vivekananda, K. V.; Kumar, Mukesh; Ganguly, Rakesh; Dey, Sandip; Jain, Vimal K. |
Journal of publication | CrystEngComm |
Year of publication | 2015 |
Journal volume | 17 |
Journal issue | 23 |
Pages of publication | 4367 |
a | 12.2175 ± 0.001 Å |
b | 13.7065 ± 0.001 Å |
c | 17.1985 ± 0.0015 Å |
α | 87.407 ± 0.007° |
β | 86.817 ± 0.007° |
γ | 69.329 ± 0.007° |
Cell volume | 2689.5 ± 0.4 Å3 |
Cell temperature | 293 ± 2 K |
Ambient diffraction temperature | 293 ± 2 K |
Number of distinct elements | 7 |
Space group number | 2 |
Hermann-Mauguin space group symbol | P -1 |
Hall space group symbol | -P 1 |
Residual factor for all reflections | 0.1307 |
Residual factor for significantly intense reflections | 0.0802 |
Weighted residual factors for significantly intense reflections | 0.2005 |
Weighted residual factors for all reflections included in the refinement | 0.239 |
Goodness-of-fit parameter for all reflections included in the refinement | 1.003 |
Diffraction radiation wavelength | 1.5418 Å |
Diffraction radiation type | CuKα |
Has coordinates | Yes |
Has disorder | No |
Has Fobs | No |
For the version history of this entry, please navigate to main COD server.
The link is: https://www.crystallography.net/7220384.html
All data in the COD and the database itself are dedicated to the
public domain and licensed under the
CC0
License
.
Users of the data should acknowledge the original authors of the
structural data.