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Information card for entry 7220724
Preview
Coordinates | 7220724.cif |
---|---|
Original paper (by DOI) | HTML |
Formula | C66 H82 Cu N4 O2 |
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Calculated formula | C66 H82 Cu N4 O2 |
SMILES | N(=C\c1cc(cc2C=[N]([Cu]3(Oc12)[N](=Cc1cc(cc(c1O3)/C=N/c1c(cccc1C(C)C)C(C)C)C)c1c(cccc1C(C)C)C(C)C)c1c(cccc1C(C)C)C(C)C)C)/c1c(cccc1C(C)C)C(C)C |
Title of publication | Mono-and Tetra-nuclear copper complexes bearing bis(imino)phenoxide derived ligands: catalytic evaluation for benzene oxidation and ROP of epsilon-caprolactone |
Authors of publication | Wang, Xue; Zhao, Keqing; Elsegood, Mark Robert James; Prior, Timothy J.; Liu, Xiaoming; Li, Wu; Sanz, Sergio; Brechin, Euan K.; Redshaw, Carl |
Journal of publication | RSC Adv. |
Year of publication | 2015 |
a | 9.8597 ± 0.0006 Å |
b | 12.1852 ± 0.0008 Å |
c | 24.1112 ± 0.0016 Å |
α | 90° |
β | 97.5566 ± 0.0013° |
γ | 90° |
Cell volume | 2871.6 ± 0.3 Å3 |
Cell temperature | 160 ± 2 K |
Ambient diffraction temperature | 160 ± 2 K |
Number of distinct elements | 5 |
Space group number | 14 |
Hermann-Mauguin space group symbol | P 1 21/c 1 |
Hall space group symbol | -P 2ybc |
Residual factor for all reflections | 0.1074 |
Residual factor for significantly intense reflections | 0.0528 |
Weighted residual factors for significantly intense reflections | 0.1035 |
Weighted residual factors for all reflections included in the refinement | 0.1247 |
Goodness-of-fit parameter for all reflections included in the refinement | 1 |
Diffraction radiation wavelength | 0.71073 Å |
Diffraction radiation type | MoKα |
Has coordinates | Yes |
Has disorder | No |
Has Fobs | No |
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The link is: https://www.crystallography.net/7220724.html
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