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Information card for entry 7220995
Preview
Coordinates | 7220995.cif |
---|---|
Original paper (by DOI) | HTML |
Formula | C42 H60 Cl2 Hf2 N2 |
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Calculated formula | C42 H60 Cl2 Hf2 N2 |
SMILES | c1(c(cccc1C(C)C)C(C)C)N1[Hf]2345([cH]6[c]2([c]3([c]4([c]56C)C)C)C)(N(c2c(cccc2C(C)C)C(C)C)[Hf]23451([cH]1[c]2([c]3([c]4([c]51C)C)C)C)Cl)Cl |
Title of publication | Mixed Amido-cyclopentadienyl Group 4 Metal Complexes |
Authors of publication | Havlik, Ales; Lamač, Martin; Pinkas, Jiri; Růžička, Aleš; Horacek, Michal |
Journal of publication | RSC Adv. |
Year of publication | 2015 |
a | 10.1859 ± 0.0005 Å |
b | 10.5241 ± 0.0009 Å |
c | 10.612 ± 0.0007 Å |
α | 113.815 ± 0.005° |
β | 103.68 ± 0.004° |
γ | 98.356 ± 0.005° |
Cell volume | 973.38 ± 0.13 Å3 |
Cell temperature | 150 ± 1 K |
Ambient diffraction temperature | 150 ± 1 K |
Number of distinct elements | 5 |
Space group number | 2 |
Hermann-Mauguin space group symbol | P -1 |
Hall space group symbol | -P 1 |
Residual factor for all reflections | 0.0293 |
Residual factor for significantly intense reflections | 0.026 |
Weighted residual factors for significantly intense reflections | 0.0632 |
Weighted residual factors for all reflections included in the refinement | 0.0651 |
Goodness-of-fit parameter for all reflections included in the refinement | 1.096 |
Diffraction radiation wavelength | 0.71073 Å |
Diffraction radiation type | MoKα |
Has coordinates | Yes |
Has disorder | No |
Has Fobs | No |
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The link is: https://www.crystallography.net/7220995.html
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Users of the data should acknowledge the original authors of the
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