Information card for entry 7221003

Structure parameters

• Common name: [P8,8,8,1][Sm(dbm)4]
• Formula: C85 H98 O8 P Sm
• Calculated formula: C85 H98 O8 P Sm
• SMILES: [Sm]1234(OC(=CC(=[O]1)c1ccccc1)c1ccccc1)([O]=C(C=C(O2)c1ccccc1)c1ccccc1)(OC(=CC(=[O]3)c1ccccc1)c1ccccc1)OC(=CC(=[O]4)c1ccccc1)c1ccccc1.[P+](C)(CCCCCCCC)(CCCCCCCC)CCCCCCCC
• Title of publication: Phosphonium-based tetrakis dibenzoylmethane Eu(III) and Sm(III) complexes: synthesis, crystal structure and photoluminescence properties in a weakly coordinating phosphonium ionic liquid
• Authors of publication: Malba, Chandrashekhar Marotirao; Enrichi, Francesco; Facchin, Manuela; Demitri, Nicola; Plaisier, Jasper Rikkert; Natile, Marta Maria; Selva, Maurizio; Riello, Pietro; Perosa, Alvise; Benedetti, A.
• Journal of publication: RSC Adv.
• Year of publication: 2015
• a: 16.169 ± 0.003 Å
• b: 22.341 ± 0.004 Å
• c: 20.962 ± 0.002 Å
• α: 90°
• β: 100.6 ± 0.02°
• γ: 90°
• Cell volume: 7443 ± 2 ų
• Cell temperature: 100 ± 2 K
• Ambient diffraction temperature: 100 ± 2 K
• Number of distinct elements: 5
• Space group number: 14
• Hermann-Mauguin space group symbol: P 1 21/c 1
• Hall space group symbol: -P 2ybc
• Residual factor for all reflections: 0.1197
• Residual factor for significantly intense reflections: 0.0879
• Weighted residual factors for significantly intense reflections: 0.2248
• Weighted residual factors for all reflections included in the refinement: 0.2559
• Goodness-of-fit parameter for all reflections included in the refinement: 1.049
• Diffraction radiation wavelength: 0.6525 Å
• Diffraction radiation type: Synchrotron
• Has coordinates: Yes
• Has disorder: Yes
• Has Fobs: No