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Information card for entry 7221724
Preview
Coordinates | 7221724.cif |
---|---|
Original paper (by DOI) | HTML |
Formula | C36 H50 Cl2 Co4 N2 O14 |
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Calculated formula | C36 H50 Cl2 Co4 N2 O14 |
SMILES | [Co]1234([OH]C)Oc5c(OC)cccc5C=[N]4c4ccccc4[O]1[Co]14([O]5([Co]([O]6[Co]75([OH]C)(Oc5c(OC)cccc5C=[N]7c5ccccc65)[O]4C)([O]21C)([O]3C)([OH]C)Cl)C)([OH]C)Cl |
Title of publication | Cobalt(ii/iii), nickel(ii) and copper(ii) coordination clusters employing a monoanionic Schiff base ligand: synthetic, topological and computational mechanistic aspects |
Authors of publication | Loukopoulos, Edward; Berkoff, Benjamin; Griffiths, Kieran; Keeble, Victoria; Dokorou, Vassiliki N.; Tsipis, Athanassios C.; Escuer, Albert; Kostakis, George E. |
Journal of publication | CrystEngComm |
Year of publication | 2015 |
Journal volume | 17 |
Journal issue | 35 |
Pages of publication | 6753 |
a | 11.7862 ± 0.0005 Å |
b | 21.7148 ± 0.0008 Å |
c | 16.764 ± 0.0006 Å |
α | 90° |
β | 101.32 ± 0.004° |
γ | 90° |
Cell volume | 4207 ± 0.3 Å3 |
Cell temperature | 173 K |
Ambient diffraction temperature | 173 K |
Number of distinct elements | 6 |
Space group number | 14 |
Hermann-Mauguin space group symbol | P 1 21/n 1 |
Hall space group symbol | -P 2yn |
Residual factor for all reflections | 0.0517 |
Residual factor for significantly intense reflections | 0.0372 |
Weighted residual factors for significantly intense reflections | 0.085 |
Weighted residual factors for all reflections included in the refinement | 0.0938 |
Goodness-of-fit parameter for all reflections included in the refinement | 1.039 |
Diffraction radiation probe | x-ray |
Diffraction radiation wavelength | 0.71073 Å |
Diffraction radiation type | MoKα |
Has coordinates | Yes |
Has disorder | No |
Has Fobs | No |
For the version history of this entry, please navigate to main COD server.
The link is: https://www.crystallography.net/7221724.html
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Users of the data should acknowledge the original authors of the
structural data.