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Information card for entry 7222465
Preview
Coordinates | 7222465.cif |
---|---|
Original paper (by DOI) | HTML |
Formula | C32 H44 Si |
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Calculated formula | C32 H44 Si |
SMILES | [C@@H]1(C(=C(c2c(c(c(c(c12)C)C)C)C)C)C)[Si]([C@H]1C(=C(c2c(c(c(c(c12)C)C)C)C)C)C)(C)C.[C@H]1(C(=C(c2c(c(c(c(c12)C)C)C)C)C)C)[Si]([C@@H]1C(=C(c2c(c(c(c(c12)C)C)C)C)C)C)(C)C |
Title of publication | Synthesis and characterisation of permethylindenyl zirconium complexes and their use in ethylene polymerisation |
Authors of publication | Buffet, Jean-Charles; Arnold, Thomas; Turner, Zoe; Angpanitcharoen, Phakpoom; OHare, Dermot |
Journal of publication | RSC Adv. |
Year of publication | 2015 |
a | 9.2291 ± 0.0007 Å |
b | 9.7804 ± 0.0007 Å |
c | 15.8873 ± 0.0012 Å |
α | 89.6 ± 0.006° |
β | 81.392 ± 0.006° |
γ | 73.234 ± 0.006° |
Cell volume | 1356.64 ± 0.18 Å3 |
Cell temperature | 150 K |
Ambient diffraction temperature | 150 K |
Number of distinct elements | 3 |
Space group number | 2 |
Hermann-Mauguin space group symbol | P -1 |
Hall space group symbol | -P 1 |
Residual factor for all reflections | 0.1118 |
Residual factor for significantly intense reflections | 0.097 |
Weighted residual factors for all reflections | 0.2791 |
Weighted residual factors for significantly intense reflections | 0.2717 |
Weighted residual factors for all reflections included in the refinement | 0.279 |
Goodness-of-fit parameter for all reflections included in the refinement | 0.9647 |
Diffraction radiation wavelength | 1.5418 Å |
Diffraction radiation type | CuKα |
Has coordinates | Yes |
Has disorder | No |
Has Fobs | No |
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The link is: https://www.crystallography.net/7222465.html
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Users of the data should acknowledge the original authors of the
structural data.