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Information card for entry 7222467
Preview
Coordinates | 7222467.cif |
---|---|
Original paper (by DOI) | HTML |
Formula | C42 H66 Cl6 Si2 Zr2 |
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Calculated formula | C42 H66 Cl6 Si2 Zr2 |
SMILES | [c]12([c]34[c]5([c]6([c]1(C)[Zr]12456([Cl][Zr]2456([c]7([c]2([c]4([c]26c(c(c(c([c]572)C)C)C)C)C)C)[Si](C)(C)CCCC)(Cl)(Cl)[Cl]1)(Cl)Cl)C)c(c(c(c3C)C)C)C)[Si](C)(C)CCCC |
Title of publication | Synthesis and characterisation of permethylindenyl zirconium complexes and their use in ethylene polymerisation |
Authors of publication | Buffet, Jean-Charles; Arnold, Thomas; Turner, Zoe; Angpanitcharoen, Phakpoom; OHare, Dermot |
Journal of publication | RSC Adv. |
Year of publication | 2015 |
a | 9.5271 ± 0.0001 Å |
b | 11.1274 ± 0.0001 Å |
c | 11.3616 ± 0.0001 Å |
α | 78.165 ± 0.001° |
β | 87.34 ± 0.001° |
γ | 77.902 ± 0.001° |
Cell volume | 1152.67 ± 0.02 Å3 |
Cell temperature | 150 ± 2 K |
Ambient diffraction temperature | 150 ± 2 K |
Number of distinct elements | 5 |
Space group number | 2 |
Hermann-Mauguin space group symbol | P -1 |
Hall space group symbol | -P 1 |
Residual factor for all reflections | 0.0292 |
Residual factor for significantly intense reflections | 0.0263 |
Weighted residual factors for significantly intense reflections | 0.0639 |
Weighted residual factors for all reflections included in the refinement | 0.0653 |
Goodness-of-fit parameter for all reflections included in the refinement | 1.133 |
Diffraction radiation wavelength | 0.71073 Å |
Diffraction radiation type | MoKα |
Has coordinates | Yes |
Has disorder | No |
Has Fobs | No |
For the version history of this entry, please navigate to main COD server.
The link is: https://www.crystallography.net/7222467.html
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Users of the data should acknowledge the original authors of the
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