Information card for entry 7224078

Structure parameters

• Formula: C28 H36 Dy2 N6 Ni2 O38
• Calculated formula: C28 H36 Dy2 N6 Ni2 O38
• SMILES: N1(=[O][Dy]23([OH2])([OH2])(O1)([OH2])([OH2])[O]1C(=[O]3)C[N]34[C@H]5[C@@H](CCCC5)[N]56CC(=O)O[Ni]146(OC(=O)C5)OC(C3)=[O][Dy]13([OH2])([O]4C(=[O]3)C[N]35[C@@H]6[C@H](CCCC6)[N]67CC(=O)O[Ni]457(OC(=O)C6)OC(C3)=[O]2)([O]=N(=O)O1)([OH2])([OH2])[OH2])=O.O.O.O.O.O.O.O.O
• Title of publication: Anion-controlled assembly of a series of heterometallic 3d‒4f compounds with 0D cluster, 1D chain, 2D network and 3D frameworks
• Authors of publication: Zhang, Han; Yan, Zhi-Hao; Luo, Yun; Zheng, Xiu-Ying; Kong, Xiang-Jian; Long, La-Sheng; Zheng, Lan-Sun
• Journal of publication: CrystEngComm
• Year of publication: 2016
• Journal volume: 18
• Journal issue: 22
• Pages of publication: 4142
• a: 9.1672 ± 0.0018 Å
• b: 12.17 ± 0.002 Å
• c: 12.442 ± 0.003 Å
• α: 85.92 ± 0.03°
• β: 79.65 ± 0.03°
• γ: 68.68 ± 0.03°
• Cell volume: 1272 ± 0.5 ų
• Cell temperature: 173 ± 2 K
• Ambient diffraction temperature: 173.15 K
• Number of distinct elements: 6
• Space group number: 2
• Hermann-Mauguin space group symbol: P -1
• Hall space group symbol: -P 1
• Residual factor for all reflections: 0.0355
• Residual factor for significantly intense reflections: 0.0316
• Weighted residual factors for significantly intense reflections: 0.0824
• Weighted residual factors for all reflections included in the refinement: 0.0985
• Goodness-of-fit parameter for all reflections included in the refinement: 1.156
• Diffraction radiation wavelength: 0.71073 Å
• Diffraction radiation type: MoKα
• Has coordinates: Yes
• Has disorder: No
• Has Fobs: No