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Information card for entry 7224311
Preview
| Coordinates | 7224311.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Formula | C8 H14 Fe2 N O12 |
|---|---|
| Calculated formula | C8 H14.0016 Fe2 N1.0002 O12 |
| Title of publication | Dielectric relaxation behavior in antiferroelectric metal organic framework [(CH3)2NH2][Fe(III)Fe(II)(HCOO)6] single crystals. |
| Authors of publication | Sieradzki, A.; Pawlus, S.; Tripathy, S. N.; Gągor, A; Ciupa, A.; Mączka, M; Paluch, M. |
| Journal of publication | Physical chemistry chemical physics : PCCP |
| Year of publication | 2016 |
| Journal volume | 18 |
| Journal issue | 12 |
| Pages of publication | 8462 - 8467 |
| a | 8.2603 ± 0.0003 Å |
| b | 8.2603 ± 0.0003 Å |
| c | 13.8466 ± 0.0004 Å |
| α | 90° |
| β | 90° |
| γ | 120° |
| Cell volume | 818.21 ± 0.05 Å3 |
| Cell temperature | 159.97 ± 0.18 K |
| Ambient diffraction temperature | 159.97 ± 0.18 K |
| Number of distinct elements | 5 |
| Space group number | 163 |
| Hermann-Mauguin space group symbol | P -3 1 c |
| Hall space group symbol | -P 3 2c |
| Residual factor for all reflections | 0.027 |
| Residual factor for significantly intense reflections | 0.0216 |
| Weighted residual factors for significantly intense reflections | 0.048 |
| Weighted residual factors for all reflections included in the refinement | 0.0499 |
| Goodness-of-fit parameter for all reflections included in the refinement | 1.041 |
| Diffraction radiation probe | x-ray |
| Diffraction radiation wavelength | 0.71073 Å |
| Diffraction radiation type | MoKα |
| Has coordinates | Yes |
| Has disorder | No |
| Has Fobs | No |
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